ML145442, ML145443
LANSDALE Semiconductor, Inc.
BLOCK DIAGRAM
4
7
CARRIER 3
DETECT
AC AMP
*
DEMOD
5
CDT
CDA
CD
RxD
RxA2 15
RxA1 16
LOW–BAND
BPF
–
+
AAF
S/H
HIGH–BAND
BPF
10
FB
1
DSI
SMOOTHING
FILTER
–
+
17
18
TxA
ExI
LB
MODE
SQT
TxD
TLA
Xout
Xin
2
13
14
11
20
8
9
MODE
CONTROL
MODULATOR
OSCILLATOR
CLOCK
DIVIDER
SAMPLING CLOCK: 77.82 kHz
SAMPLING CLOCK: 19.46 kHz
INTERNAL
VAG
ANALOG
GROUND
GENERATOR
19
6
12
VAG
VDD
VSS
* Refer to the FB pin description.
ABSOLUTE MAXIMUM RATINGS
(Voltages Referenced to VSS)
Rating
Supply Voltage
DC Input Voltage
DC Output Voltage
Clamp Diode Current, per Pin
DC Output Current, per Pin
Power Dissipation
Operating Temperature Range
Storage Temperature Range
Symbol
VDD
Vin
Vout
IIK, IOK
Iout
PD
TA
Tstg
Value
–0.5 to 7.0
–0.5 to VDD + 0.5
–0.5 to VDD + 0.5
±20
±28
500
–40 to 85
–65 to 150
Unit
V
V
V
mA
mA
mW
°C
°C
This device contains circuitry to protect the
inputs against damage due to high static volt-
ages or electric fields; however, it is advised that
normal precautions be taken to avoid application
of any voltage higher than maximum rated
voltages to this high impedance circuit. For
proper operation it is recommended that Vin and
Vout be constrained to the range VSS
≤
(Vin or
Vout)
≤
VDD).
Unused inputs must always be tied to an
appropriate logic voltage level (e.g., either VSS
or VDD).
RECOMMENDED OPERATING CONDITIONS
Parameter
Supply Voltage
DC Input or Output Voltage
Input Rise or Fall Time
Crystal Frequency*
Symbol
VDD
Vin, Vout
tr, tf
fcrystal
Min
4.5
0
—
3.2
Max
5.5
VDD
500
5.0
Unit
V
V
ns
MHz
* Changing the crystal frequency from 3.579 MHz will change the output frequencies. The
change in output frequency will be proportional to the change in crystal frequency.
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