Specifications
GAL22V10D
Specifications
GAL22V10
AC Switching Characteristics
Over Recommended Operating Conditions
COM
PARAM
TEST
COND.
1
COM
COM/IND
DESCRIPTION
Input or I/O to Combinatorial Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Fdbk before Clk↑
Hold Time, Input or Fdbk after Clk↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
Input or I/O to Output Disabled
Input or I/O to Asynch. Reset of Reg.
Asynch. Reset Pulse Duration
Asynch. Reset to Clk↑ Recovery Time
Synch. Preset to Clk↑ Recovery Time
1
1
—
2.5
0
167
-4
4
3.5
2.5
—
—
—
1
1
—
3
0
-5
5
4
3
—
—
—
1
1
—
4.5
0
111
-7
7.5
4.5
3
—
—
—
UNITS
ns
ns
ns
ns
ns
MHz
MIN. MAX. MIN. MAX. MIN. MAX.
t
pd
t
co
t
cf
2
t
su
t
h
A
A
—
—
—
A
142.8
f
max
3
A
A
200
250
—
—
166
200
—
—
133
166
—
—
MHz
MHz
t
wh
t
wl
t
en
t
dis
t
ar
t
arw
t
arr
t
spr
—
—
B
C
A
—
—
—
2
2
1
1
1
4.5
3
3
—
—
5
5
4.5
—
—
—
2.5
2.5
1
1
1
4.5
4
4
—
—
6
5.5
5.5
—
—
—
3
3
1
1
1
7
5
5
—
—
7.5
7.5
9
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Description
section.
3) Refer to
fmax Description
section. Characterized initially and after any design or process changes that may affect these
parameters.
Capacitance (T
A
= 25°C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
8
8
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
7
LATTICE [ LATTICE SEMICONDUCTOR ]
