Specifications
GAL16V8D
AC Switching Characteristics
Over Recommended Operating Conditions
COM
PARAMETER
COM
COM / IND
TEST
COND
1
.
A
A
—
—
—
A
A
A
DESCRIPTION
Input or I/O to Comb. Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
OE
to Output Enabled
Input or I/O to Output Disabled
OE
to Output Disabled
1
1
—
2.5
0
182
200
250
-3
3.5
3
2.5
—
—
1
1
—
3
0
-5
5
4
3
—
—
1
1
—
5
0
100
125
125
-7
UNITS
ns
ns
ns
ns
ns
MHz
MHz
MHz
7.5
5
3
—
—
—
—
—
MIN. MAX. MIN. MAX. MIN. MAX.
t
pd
t
co
t
cf
2
t
su
t
h
Select devices have been discontinued.
See Ordering Information section for product status.
— 142.8 —
—
—
166
166
—
—
f
max
3
t
wh
t
wl
t
en
t
dis
—
—
B
B
C
C
2
4
2
4
—
—
—
—
—
—
4.5
4.5
4.5
4.5
3
4
3
4
1
1
1
1
—
—
6
6
5
5
4
4
1
1
1
1
—
—
9
6
9
6
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Descriptions
section.
3) Refer to
fmax Descriptions
section. Characterized but not 100% tested.
4) Characterized but not 100% tested.
Capacitance (T
A
= 25
°
C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
8
8
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
12
LATTICE [ LATTICE SEMICONDUCTOR ]
