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MACH445-20YC 参数 Datasheet PDF下载

MACH445-20YC图片预览
型号: MACH445-20YC
PDF下载: 下载PDF文件 查看货源
内容描述: 高密度EE CMOS可编程逻辑 [High-Density EE CMOS Programmable Logic]
分类和应用: 可编程逻辑器件输入元件时钟
文件页数/大小: 28 页 / 212 K
品牌: LATTICE [ LATTICE SEMICONDUCTOR ]
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ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . –65°C to +150°C
Ambient Temperature
with Power Applied . . . . . . . . . . . . . –55°C to +125°C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . –0.5 V to +7.0 V
DC Input Voltage . . . . . . . . . . . . –0.5 V to V
CC
+0.5 V
DC Output or
I/O Pin Voltage . . . . . . . . . . . . . –0.5 V to V
CC
+0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current
(T
A
= 0°C to +70°C) . . . . . . . . . . . . . . . . . . . . 200 mA
OPERATING RANGES
Commercial (C) Devices
Temperature (T
A
) Operating
in Free Air . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C
Supply Voltage (V
CC
) with
Respect to Ground . . . . . . . . . . . . +4.75 V to +5.25 V
Operating ranges define those limits between which the
functionality of the device is guaranteed.
Stresses above those listed under Absolute Maximum
Ratings may cause permanent device failure. Functionality at
or above these limits is not implied. Exposure to Absolute
Maximum Ratings for extended periods may affect device
reliability. Programming conditions may differ.
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified
Parameter
Symbol
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
SC
I
CC
Parameter Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input HIGH Leakage Current
Input LOW Leakage Current
Off-State Output Leakage
Current HIGH
Off-State Output Leakage
Current LOW
Output Short-Circuit Current
Supply Current
Test Conditions
I
OH
= –3.2 mA, V
CC
= Min
V
IN
= V
IH
or V
IL
I
OL
= 24 mA, V
CC
= Min
V
IN
= V
IH
or V
IL
(Note 1)
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 2)
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 2)
V
IN
= 5.25 V, V
CC
= Max (Note 3)
V
IN
= 0 V, V
CC
= Max (Note 3)
V
OUT
= 5.25 V, V
CC
= Max
V
IN
= V
IH
or V
IL
(Note 3)
V
OUT
= 0 V, V
CC
= Max
V
IN
= V
IH
or V
IL
(Note 3)
V
OUT
= 0.5 V, V
CC
= Max (Note 4)
V
IN
= 0 V, Outputs Open (I
OUT
= 0 mA)
V
CC
= 5.0 V, f =25 MHz, T
A
= 25°C (Note 5)
–30
255
2.0
0.8
10
–100
10
–100
–160
Min
2.4
0.5
Typ
Max
Unit
V
V
V
V
µA
µA
µA
µA
mA
mA
CAPACITANCE (Note 6)
Parameter
Symbol
C
IN
C
OUT
Parameter Description
Input Capacitance
Output Capacitance
Test Conditions
V
IN
= 2.0 V
V
OUT
= 2.0 V
V
CC
= 5.0 V, T
A
= 25°C,
f = 1 MHz
Typ
6
8
Unit
pF
pF
Notes:
1.
2.
3.
4.
Total I
OL
for one PAL block should not exceed 128 mA.
These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
I/O pin leakage is the worst case of I
IL
and I
OZL
(or I
IH
and I
OZH
).
Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.
V
OUT
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
5. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and capable of being loaded,
enabled, and reset.
6. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified
where capacitance may be affected.
MACH445-12 (Com’l)
9