ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C
Ambient Temperature
with Power Applied . . . . . . . . . . . . . .-55°C to +125°C
Supply Voltage
with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V
DC Input Voltage . . . . . . . . . . . -0.5 V to V
CC
+ 0.5 V
DC Output or I/O
Pin Voltage . . . . . . . . . . . . . . . . . -0.5 V to V
CC
+ 0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current (T
A
= -40°C to +85°C). . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (T
A
)
Operating in Free Air . . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage (V
CC
)
with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
Industrial (I) Devices
Temperature (T
A
) Operating
in Free Air . . . . . . . . . . . . . . . . . . . . . . -40°C to +85°C
DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING
RANGES
Parameter
Symbol
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
SC
I
CC
(Dynamic)
Parameter Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Test Description
Min
2.4
0.5
2.0
0.8
10
–100
10
–100
–30
–150
115
130
Max
Unit
V
V
V
V
µA
µA
µA
µA
mA
mA
mA
Input HIGH Leakage Current
Input LOW Leakage Current
U
SE
Off-State Output Leakage Current HIGH
Off-State Output Leakage Current LOW
Output Short-Circuit Current
Commercial Supply Current
Industrial Supply Current
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
IL
and I
OZL
(or I
IH
and I
OZH
).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
V
OUT
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
G
N AL
EW D
EV
D
ES IC
IG ES
N F
S O
I
OH
= –3.2 mA, V
IN
= V
IH
or V
IL
, V
CC
= Min
I
OL
= 24 mA, V
IN
= V
IH
or V
IL
, V
CC
= Min
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
V
IN
= 5.25 V, V
CC
= Max (Note 2)
V
IN
= 0 V, V
CC
= Max (Note 2)
V
OUT
= 5.25 V, V
CC
= Max
V
IN
= V
IH
or V
IL
(Note 2)
V
OUT
= 0 V, V
CC
= Max
V
IN
= V
IH
or V
IL
(Note 2)
V
OUT
= 0.5 V, V
CC
= Max (Note 3)
Outputs Open (I
OUT
= 0 mA)
V
CC
= Max, f = 15 MHz
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
PALCE16V8H-10 (Com’l, Ind)
R
Supply Voltage (V
CC
)
with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
13
LATTICE [ LATTICE SEMICONDUCTOR ]
