ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C
Industrial (I) Devices
Ambient Temperature
with Power Applied . . . . . . . . . . . . . .-55°C to +125°C
Ambient Temperature (T ) Operating
A
in Free Air. . . . . . . . . . . . . . . . . . . . . . -40°C to +85°C
Supply Voltage
with Respect to Ground . . . . . . . . . . -0.5 V to +7.0 V
Supply Voltage (V
with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
)
CC
DC Input Voltage . . . . . . . . . . . -0.5 V to V
+ 0.5 V
Opera tin g ra n ges defin e those limits between which the
functionality of the device is guaranteed.
CC
DC Output or I/O
Pin Voltage . . . . . . . . . . . . . . . . .-0.5 V to V + 0.5 V
CC
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current (T = -40°C to +85°C) . . . . . . 100 mA
A
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES
Parameter
Symbol
Parameter Description
Output HIGH Voltage
Test Description
= -3.2 mA, V = V or V , V = Min
Min
Max
Unit
V
V
I
2.4
OH
OH
IN
IH
IL CC
V
Output LOW Voltage
I
= 24 mA, V = V or V , V = Min
0.5
V
OL
OL
IN
IH
IL CC
V
Input HIGH Voltage
Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1)
Guaranteed Input Logical LOW Voltage for all Inputs (Note 1)
2.0
V
IH
V
Input LOW Voltage
0.8
10
V
IL
I
Input HIGH Leakage Current
Input LOW Leakage Current
Off-State Output Leakage Current HIGH
Off-State Output Leakage Current LOW
Output Short-Circuit Current
V = 5.5 V, V = Max (Note 2)
µA
µA
µA
µA
mA
IH
IN
CC
I
V = 0 V, V = Max (Note 2)
–100
10
IL
IN
CC
I
V
= 5.5 V, V = Max , V = V or V (Note 2)
OZH
OUT CC IN IH IL
I
V
= 0 V, V = Max , V = V or V (Note 2)
–100
–150
130
65
OZL
OUT
CC
IN
IH
IL
I
V
= 0.5 V, V = Max (Note 3)
–30
SC
OUT
CC
H
Q
Outputs Open (I = 0 mA),
OUT
I
Supply Current
mA
CC
V = Max, f = 15 MHz
CC
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I and I (or I and I ).
IL
OZL
IH
OZH
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
V
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
OUT
16
PALCE20V8H-15/25 Q-20/25 (ind)
LATTICE [ LATTICE SEMICONDUCTOR ]
