LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LG-110-9SEF-CT
Reliability Test:
Page 10/10
Classification
Test Item
Test Condition
1.Ta=Under Room Temperature As Per Data Sheet
Maximum Rating.
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
Reference
Standard
MIL-STD-750D: 1026
MIL-STD-883D: 1005
JIS C 7021: B-1
Operating Life Test
High Temperature
Storage Test
Endurance
Test
Low Temperature
Storage Test
1.Ta=105
℃±
5
℃
2.t=1000 hrs (-24hrs, +72hrs)
MIL-STD-883D:1008
JIS C 7021: B-10
1.Ta=-40
℃±
5
℃
2.t=1000 hrs (-24hrs, +72hrs)
JIS C 7021: B-12
High Temperature
High Humidity
Storage Test
1.Ta=65
℃±
5
℃
2.RH=90 %~95%
3.t=1000hrs
±
2hrs
MIL-STD-202F:103B
JIS C 7021: B-11
Thermal Shock Test
1.Ta=105
℃±
5
℃
&-40
℃±
5
℃
(10min)
(10min)
2.total 10 cycles
MIL-STD-202F: 107D
MIL-STD-750D: 1051
MIL-STD-883D: 1011
MIL-STD-202F: 208D
MIL-STD-750D: 2026
MIL-STD-883D: 2003
IEC 68 Part 2-20
JIS C 7021: A-2
MIL-STD-202F: 107D
MIL-STD-750D: 1051
MIL-STD-883D: 1010
JIS C 7021: A-4
Solderability Test
1.T.Sol=235
℃±
5
℃
2.Immersion time 2
±
0.5sec
3.Coverage
≧
95% of the dipped surface
Environmental
Test
Temperature
Cycling
1.105
℃ ~
25
℃ ~ -
55
℃ ~
25
℃
30mins 5mins 30mins 5mins
2.10 Cyeles
IR Reflow
1.T=260 ° C Max. 10sec.Max.
2. 6 Min
MIL-STD-750D:2031.2
J-STD-020
LIGITEK [ LIGITEK ELECTRONICS CO., LTD. ]
