28C256T
256K EEPROM (32K x 8-Bit) EEPROM
Product Ordering Options
Model Number
28C256T
XX
X
X
-XX
Option Details
12 = 120 ns
Feature
Access Time
15 = 150 ns
Monolithic
Screening Flow
S = Maxwell Class S
B = Maxwell Class B
E = Engineering (testing @ +25°C)
I = Industrial (testing @ -55°C,
+25°C, +125°C)
D = Dual In-line Package (DIP)
F = Flat Pack
Package
RP = RAD-PAK® package
RT1 = Guaranteed to 10 krad at
die level
Radiation Feature
RT2 = Guaranteed to 25 krad at
die level
RT4 = Guaranteed to 40 krad at
die level
256K EEPROM (32K x 8-Bit)
EEPROM
Base Product
Nomenclature
02.18.02 Rev5
All data sheets are subject to change without notice 14
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All rights reserved.
MAXWELL [ MAXWELL TECHNOLOGIES ]
