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5962-3826718QWM 参数 Datasheet PDF下载

5962-3826718QWM图片预览
型号: 5962-3826718QWM
PDF下载: 下载PDF文件 查看货源
内容描述: 微型电路,存储器,数字, CMOS 128K ×8位EEPROM ,单片硅 [MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K x 8 BIT EEPROM, MONOLITHIC SILICON]
分类和应用: 存储可编程只读存储器电动程控只读存储器电可擦编程只读存储器
文件页数/大小: 40 页 / 315 K
品牌: MAXWELL [ MAXWELL TECHNOLOGIES ]
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2. APPLICABLE DOCUMENTS  
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part  
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the  
issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the  
solicitation.  
SPECIFICATION  
DEPARTMENT OF DEFENSE  
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.  
STANDARDS  
DEPARTMENT OF DEFENSE  
MIL-STD-883  
-
Test Method Standard Microcircuits.  
MIL-STD-1835 - Interface Standard for Microcircuit Case Outlines.  
HANDBOOKS  
DEPARTMENT OF DEFENSE  
MIL-HDBK-103 - List of Standard Microcircuit Drawings.  
MIL-HDBK-780 - Standard Microcircuit Drawings.  
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization  
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094).  
2.2 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless  
otherwise specified, the issues of the documents which are DoD adopted are those listed in the issue of the DODISS cited in the  
solicitation. Unless otherwise specified, the issues of documents not listed in the DODISS are the issues of the documents cited  
in the solicitation.  
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)  
ASTM Standard F1192-88  
-
Standard Guide for the Measurement of Single Event Phenomena from  
Heavy Ion Irradiation of Semiconductor Devices.  
(Applications for copies of ASTM publications should be addressed to the American Society for Testing and Materials, 1916  
Race Street, Philadelphia, PA 19103).  
ELECTRONICS INDUSTRIES ASSOCIATION (EIA)  
JEDEC Standard EIA/JESD78 - I/C Latch-up Test.  
(Applications for copies should be addressed to the Electronics Industries Association, 2500 Wilson Boulevard, Arlington,  
VA 22201).  
(Non-Government standards and other publications are normally available from the organizations that prepare or distribute  
the documents. These documents also may be available in or through libraries or other informational services).  
2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of  
this drawing shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a  
specific exemption has been obtained.  
SIZE  
STANDARD  
MICROCIRCUIT DRAWING  
5962-38267  
A
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
G
SHEET  
4
DSCC FORM 2234  
APR 97