表一，电气性能特点 - 持续。
TEST
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|符号
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| CIN
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| COUT
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| tAVAV
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| tAVQV
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| tELQV
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| tOLQV
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| tELQX
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| tEHQZ
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条件
| -55
(
C
TC
+125
(
C
| VSS = 0 V ; 4.5 V
VCC
5.5 V
|除非另有规定
|
| VIN = 0 V ， F = 1.0 MHz时，
| TC = 25
(
C，见4.4.1c
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| VOUT = 0 V ， F = 1.0 MHz的
| TC = 25
(
C，见4.4.1c
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|查看4.4.1d
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|参见图4，图5，图6为
|适用。
5/
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| A组
|分组
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| 4
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| 4
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| 7,8A ， 8B
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|9, 10, 11
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|9, 10, 11
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|9, 10, 11
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|9, 10, 11
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|9, 10, 11
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|9, 10, 11
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|设备
|类型
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|全部
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|全部
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|全部
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|01-02,16
|03-04,17
|05-06,18
| 07,08,
| 13,19
| 09,10,
| 14
| 11,12,
| 15
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|01-02,16
|03-04,17
|05-06,18
| 07,08,
| 13,19
| 09,10,
| 14
| 11,12,
| 15
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|01-02,16
|03-04,17
|05-06,18
| 07,08,
| 13,19
| 09,10,
| 14
| 11,12,
| 15
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| 01-06
| 07-15
| 16-19
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|全部
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| 01-06
| 07-19
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范围
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民|
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250 |
200 |
150 |
120 |
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90
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70
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0
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|单位
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最大|
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10.0 | pF的
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12.0 | pF的
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| NS
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250 |
200 |
150 |
120 | NS
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90
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70
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250 |
200 |
150 |
120 | NS
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90
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70
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55
| NS
50
|
75
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| NS
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55
| NS
50
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输入电容3/4 /
输出电容3/4 /
功能测试
读周期时间
地址访问时间
CE访问时间
OE访问时间
行政长官在低Z输出
4/
芯片禁用输出
在高Z
4/
参见脚注表的末尾。
SIZE
标准
微电路图纸
哥伦布国防供应中心
美国俄亥俄州哥伦布市43216-5000
DSCC FORM 2234
APR 97
A
修订级别
G
5962-38267
片
9
MAXWELL [ MAXWELL TECHNOLOGIES ]
