1/2-INCH VGA (WITH FREEZE-FRAME) CMOS
ACTIVE-PIXEL DIGITAL IMAGE SENSOR
1/2-INCH CMOS ACTIVE-
PIXEL CMOS IMAGE
SENSOR
Features
• Array Format: Active: 659H x 494V
• Pixel Size and Type: 9.9µm x 9.9µm TrueSNAP™
(shuttered-node active pixel)
• Optical Format: 1/2-inch
• Frame Rate: 0-200 frames/sec progressive scan
• Data Rate: 66 MB/s (master clock 66 MHz)
• Responsivity: 2.0 V/lux-sec with source Illumination
at 550nm
• SNR: 45dB
• ADC: On-chip, 10-bit
• Power: 130mW at 200 fps
• Supply Voltage: +3.3V
• Internal Intra-Scene Dynamic Range: 60dB
• Operating Temperature: -5°C to +70°C
• Output: 10-bit digital through a single port
• Shutter: TrueSNAP freeze-frame electronic shutter
• Interface Mode: Master/Snapshot/Slave (with
simultaneous or sequential exposure/readout)
• Shutter Efficiency: 98.5%
• Shutter Exposure Time:
• Master Mode or Snapshot Mode: 2 rows to 256
frames (20µs to 1.3 sec with 66 MHz clock)
• Slave Mode: user controlled
• Gain: 1x–18x (step size = 1) or 0.5x–9x
(step size = 0.5)
• Control Interface: Two-wire serial interface
• Package: 48-pin CLCC
• Timing and Control:
On-chip:
• ADC controls, output multiplexing, ADC calibra-
tion via two-wire serial interface, exposure time,
read/write ADC calibration coefficients, window
size and location, gain, biases, master vs. snap-
shot vs. slave, simultaneous vs. continuous expo-
sure/readout, progressive vs. interlace, ADC
reference, vertical and horizontal blanking.
Off-chip:
• Exposure trigger (snapshot mode), exposure and
readout timing (slave mode)
• Color Specifications: monochrome or color (Bayer
pattern)
MT9V403
Micron Part Number: MT9V403C12ST
Description
The Micron
®
Imaging MT9V403 VGA-based CMOS
active-pixel sensor has a 1/2-inch optical format and
delivers superb resolution at a turbocharged 200 fps,
making it the perfect solution for machine vision
assembly lines, airbag deployment, golf swing analysis,
and special effects in movies. The freeze-frame shutter
allows the signal charges of all pixels to be integrated
in parallel—all pixels start integrating simultaneously
and stop integrating simultaneously. The charges are
then sampled into pixel analog memories (one mem-
ory per pixel) and consequently, row by row, are digi-
tized and read out-of-chip. The sensor works in
master, snapshot, or slave mode. In master mode it
generates the readout timing on-chip. In snapshot
mode it accepts an external trigger and then generates
the readout timing. In slave mode the sensor accepts
external readout timing. The integration time is pro-
grammed through the two-wire serial interface (mas-
ter or snapshot mode) or controlled via externally-
generated control signals (slave mode).
The scanning mode can be progressive or inter-
laced. There is also an option to scan just a window of
interest by choosing start row and column and stop
row and column. The user can control the frame rate
and row rate through the use of vertical and horizontal
blanking as well as the master clock frequency.
The readout of the data out of the chip can be done
simultaneously with integration and ADC operation
due to the two-cell SRAM which allows data from the
previously converted row to be shifted into the output
memory for readout.
The sensor’s ADCs contain special self-calibrating
circuitry that allow the sensor to reduce its own col-
umn-wise fixed pattern noise. The calibration coeffi-
cients can be read from, and written to, the sensor.
09005aef80c07280
MT9V403_DS.fm - Rev. B 1/04 EN
1
©2004 Micron Technology, Inc.
PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.
MICRON [ MICRON TECHNOLOGY ]
