32Mb, 3V, Multiple I/O Serial Flash Memory
DC Characteristics and Operating Conditions
DC Characteristics and Operating Conditions
Table 36: DC Current Characteristics and Operating Conditions
Parameter
Input leakage current
Output leakage current
Standby current
Operating current
(fast-read extended I/O)
Symbol
I
LI
I
LO
I
CC1
I
CC3
S = V
CC
, V
IN
= V
SS
or V
CC
C = 0.1V
CC
/0.9V
CC
at 108 MHz, DQ1
= open
C = 0.1V
CC
/0.9V
CC
at 54 MHz, DQ1
= open
Operating current (fast-read dual I/O)
Operating current (fast-read quad I/O)
Operating current (program)
Operating current (write status regis-
ter)
Operating current (erase)
I
CC4
I
CC5
I
CC6
C = 0.1V
CC
/0.9V
CC
at 108 MHz
C = 0.1V
CC
/0.9V
CC
at 108 MHz
S# = V
CC
S# = V
CC
S# = V
CC
Test Conditions
Min
–
–
–
–
–
–
–
–
–
–
Max
±2
±2
100
15
6
18
20
20
20
20
Unit
µA
µA
µA
mA
mA
mA
mA
mA
mA
mA
Table 37: DC Voltage Characteristics and Operating Conditions
Parameter
Input low voltage
Input high voltage
Output low voltage
Output high voltage
Symbol
V
IL
V
IH
V
OL
V
OH
I
OL
= 1.6mA
I
OH
= –100µA
Conditions
Min
–0.5
0.7V
CC
–
V
CC
- 0.2
Max
0.3V
CC
V
CC
+ 0.4
0.4
–
Unit
V
V
V
V
PDF: 09005aef84566622
n25q_32mb_3v_65nm.pdf - Rev. G 9/12 EN
70
Micron Technology, Inc. reserves the right to change products or specifications without notice.
©
2011 Micron Technology, Inc. All rights reserved.