www.micronetics.com/Noise_Source_SMT/Surface_Mount_Microwave.pdf
SMN7114
S
URFACE
M
OUNT
A
MPLIFIED
N
OISE
S
OURCE
100 MH
Z TO
3.0 GH
Z
D
ESCRIPTION
The SMN7114 noise module is designed
for a wide range of circuit boards. It
features high ENR output for uses from
built-in-test to jamming. All biasing cir -
cuitry is built-in making it easy to design
into your system. It features a built-in
voltage regulator for highly stable output
even if your DC supply lines are not.
7114-C2A
S
UITABLE FOR
H
IGH
V
OLUME
P
RODUCTS
:
SMN7114 T
YPICAL
D
ATA
The SMN7114 noise source being sur -
face mount, having a small footprint and
available on tape and reel make them
ideal for production manufacturing.
Traditionally packaged microwave noise
sources have been large and costly ren -
dering them unsuitable for all but large
expensive systems. The benefits of
having built-in test and calibration can
now be brought to mass produced prod -
ucts so they too can realize the benefits
of an onboard noise source.
S
PECIFICATIONS
• Frequency:
• ENR:
• Flatness:
• Impedance:
• VSWR:
• Bias:
100 MHz to 3.0 GHz
45 dB min
2.5 dB max
50 ohms
On-state 1.5:1 (
max)
Off-state 1.8:1 (
max)
+8 to +18 Vdc
@ 90 mA max
A
PPLICATION
N
OTE
Using noise for built-in test:
There are two primary uses for employing a noise signal for built-in test.
1. Noise Temperature (noise figure) or sensitivity testing: This test uses the noise source to supply a
known excess noise ratio (ENR) to a device under test for a Y-factor measurement. By taking two
receiver readings, one with the noise on and one with it off, Y-factor can be determined. By knowing
the ENR and Y-factor, one can calculate noise temperature (figure) or sensitivity.
2. Frequency Response: The noise source being broadband can be used as a replacement of a swept
source to calculate frequency response of a receiver or other device. By putting in a known spectral
signal at the input and taking a reading at the output, one can determine the gain or loss over frequency
of the entire system. Noise sources are inherently extremely stable devices. In addition, the circuitry is
much simpler than a swept source which increases reliability and lowers cost.
For more information on using noise for built-in-test, read the Feb 2004 Microwave Journal article authored
by Patrick Robbins of Micronetics.
• Operating Temp: -40 to +85
o
C
• Storage Temp:
• ENR vs Temp:
• Shutdown Input:
-54 to +125
o
C
0.04 dB / deg C
( T T L Compatible)
Logic “0” = Noise Off
Logic “1” (open) = Noise On
MICRONETICS, HUDSON, NH 03051 / TEL: 603-883-2900 / FAX: 603-882-8987 / NOISESALES@MICRONETICS.COM
WWW.MICRONETICS.COM
MICRONETICS [ MICRONETICS, INC. ]
