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V53C808H45 参数 Datasheet PDF下载

V53C808H45图片预览
型号: V53C808H45
PDF下载: 下载PDF文件 查看货源
内容描述: 高性能1M ×8位EDO页模式的CMOS动态RAM可选自刷新 [HIGH PERFORMANCE 1M x 8 BIT EDO PAGE MODE CMOS DYNAMIC RAM OPTIONAL SELF REFRESH]
分类和应用:
文件页数/大小: 18 页 / 138 K
品牌: MOSEL [ MOSEL VITELIC, CORP ]
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MO SEL VITELIC  
V53C808H  
Waveforms of Self Refresh Cycle (Optional)  
t
RP (3)  
t
RASS (54)  
t
RPS (57)  
V
IH  
RAS  
t
RPC (48)  
V
IL  
t
RPC (48)  
t
t
CSR (47)  
CP (43)  
t
CHS (56)  
t
CHD (57)  
V
IH  
UCAS, LCAS  
ADDRESS  
V
IL  
V
IH  
V
IL  
V
OH  
I/O  
WE  
OE  
OPEN  
V
OL  
V
IH  
V
IL  
V
IH  
V
IL  
808H-17  
Functional Description  
Read Cycle  
The V53C808H is a CMOS dynamic RAM opti-  
mized for high data bandwidth, low power applica-  
tions. It is functionally similar to a traditional  
dynamic RAM. The V53C808H reads and writes  
data by multiplexing an 20-bit address into a 10-bit  
row and a 10-bit column address. The row address  
is latched by the Row Address Strobe (RAS). The  
column address “flows through” an internal address  
buffer and is latched by the Column Address Strobe  
(CAS). Because access time is primarily dependent  
on a valid column address rather than the precise  
time that the CAS edge occurs, the delay time from  
RAS to CAS has little effect on the access time.  
A Read cycle is performed by holding the Write  
Enable (WE) signal High during a RAS/CAS opera-  
tion. The column address must be held for a mini-  
mum specified by t . Data Out becomes valid only  
AR  
when t  
, t  
, t  
and t  
are all satisifed. As  
OAC RAC CAA  
CAC  
a result, the access time is dependent on the timing  
relationships between these parameters. For exam-  
ple, the access time is limited by t  
when t  
,
CAA  
RAC  
t
and t  
are all satisfied.  
CAC  
OAC  
Write Cycle  
A Write Cycle is performed by taking WE and  
CAS low during a RAS operation. The column ad-  
dress is latched by CAS. The Write Cycle can be  
WE controlled or CAS controlled depending on  
whether WE or CAS falls later. Consequently, the  
input data must be valid at or before the falling edge  
of WE or CAS, whichever occurs last. In the CAS-  
controlled Write Cycle, when the leading edge of  
WE occurs prior to the CAS low transition, the I/O  
data pins will be in the High-Z state at the beginning  
of the Write function. Ending the Write with RAS or  
CAS will maintain the output in the High-Z state.  
In the WE controlled Write Cycle, OE must be in  
Memory Cycle  
A memory cycle is initiated by bringing RAS low.  
Any memory cycle, once initiated, must not be end-  
ed or aborted before the minimum t  
time has ex-  
RAS  
pired. This ensures proper device operation and  
data integrity. A new cycle must not be initiated until  
the minimum precharge time t /t has elapsed.  
RP CP  
the high state and t  
must be satisfied.  
OED  
V53C808H Rev. 1.5 April 1998  
14