TQ-SMD
12.-(1) Malfunctional shock (single side stable)
Tested sample: TQ2SA-12V, 6 pcs
Z'
Y
Y'
Z X
X'
Y
1000m/s
2
Deenergized
condition
Energized
condition
Z'
1000m/s
2
12.-(2) Malfunctional shock (latching)
Tested sample: TQ2SA-L2-12V, 6 pcs.
Z'
Y
Y'
Z X
X'
Y
1000m/s
2
Reset condition
Set condition
Z'
1000m/s
2
X
1000m/s
2
X
1000m/s
2
1000m/s
2
Z
1000m/s
2
Y'
1000m/s
2
X'
1000m/s
2
Z
1000m/s
2
Y'
1000m/s
2
X'
13.-(1) Influence of adjacent mounting
Tested sample: TQ2SA-12V, 5 pcs.
Rate of change, %
10
Pick-up voltage
0
–10
ON
ON
ON
13.-(2) Influence of adjacent mounting
Tested sample: TQ2SA-12V, 6 pcs.
Rate of change, %
10
Pick-up voltage
0
ON
–10
ON
10
0
–10
OFF
0
1
2 3
4 5
6
.039 .079 .118 .157 .197 .236
Inter-relay distance , mm
inch
Drop-out voltage
OFF
OFF
ON
13.-(3) Influence of adjacent mounting
Tested sample: TQ2SA-12V, 6 pcs.
Rate of change, %
10
Pick-up voltage
0
–10
ON
ON
ON
ON
Rate of change, %
Rate of change, %
10
Drop-out voltage
0
–10
0
OFF OFF
Rate of change, %
10
0
–10
0
OFF
Drop-out voltage
OFF
OFF
OFF
1
2 3
4 5
6
.039 .079 .118 .157 .197 .236
Inter-relay distance , mm
inch
OFF
1
2 3
4 5
6
.039 .079 .118 .157 .197 .236
Inter-relay distance , mm
inch
14. Pulse dialing test
Tested sample: TQ2SA-12V, 6 pcs.
(35 mA 48 V DC wire spring relay load)
Change of pick-up and drop-out voltage
(mounting by IRS method)
Ratio against the rated voltage, %V
100
90
Contact resistance, mΩ
80
70
60
50
40
30
20
10
0
IRS
10
20
30
40
No. of operations,
×10
4
50
Drop-out voltage
Pick-up voltage
Max.
Min.
Change of contact resistance
(mounting by IRS method)
100
90
80
70
60
50
40
30
20
10
0
IRS
10
20
30
40
No. of operations,
×10
4
50
Max.
Min.
Circuit
+
0.08
µF
48 V DC
458
Ω
0.08
µF
TQ-SMD
3
relay
2
–
458
Ω
Wire spring relay
Max.
Min.
144
9/1/2000
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