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NHR直流电子负载4100/4110型 参数 Datasheet PDF下载

NHR直流电子负载4100/4110型图片预览
型号: NHR直流电子负载4100/4110型
PDF下载: 下载PDF文件 查看货源
内容描述: 300W , 60A的模块>每个机箱有6个负载单元>可并联作为“虚拟”负载单元>可在低于1V的低压下运行>>>4100/4110型直流电子负载功能强大,灵活度高,所占空间小,与采用多个电压和电流范围小的同类产品相比,其总成本更低。>NHR公司的主要产品有高性能自动电源测试系统、各类交/直流电子负载及可编程电源。可测试AC-DC、DC-DC、DC-AC、AC-AC电源,包括商用电源UPS ,计算机电源等。>>本信息网址: HTTP : //www.wellking.com/default/NewProductShow.asp ID = 491 [300W,60A的模块 每个机箱有6个负载单元 可并联作为“虚拟”负载单元 可在低于1V的低压下运行 4100/4110型直流电子负载功能强大,灵活度高,所占空间小,与采用多个电压和电流范围小的同类产品相比,其总成本更低。 NHR公司的主要产品有高性能自动电源测试系统、各类交/直流电子负载及可编程电源。可测试AC-DC、DC-DC、DC-AC、AC-AC电源, 包括商用电源UPS、计算机电源等。 本信息网址:http://www.wellking.com/default/NewProductShow.asp?ID=491 ]
分类和应用: 测试电子计算机
文件页数/大小: 2 页 / 63 K
品牌: NEL [ NEL FREQUENCY CONTROLS,INC ]
 浏览型号NHR直流电子负载4100/4110型的Datasheet PDF文件第2页  
DC Electronic Loads
Ultra-Compact, Modular Loads
Model 4100/4110
300 W, 60 A modules
Up to 6 loads in a 5
1
/
4
-inch
high chassis
Parallelable “virtual” loads
Below 1 volt operation
The Model 4100 and 4110 electronic loads are
designed for use within the S300 Power Subsystem.
These highly versatile loads may be used in any com-
bination together with DC sources within the same
6-slot chassis. The use of such wide-capability modu-
lar loads yields more flexibility, less rack space, and
lower cost than an assortment of loads each having
limited voltage and current range.
BROAD OPERATING ENVELOPE
To cover the full spectrum of supply-under-test output
voltages, the Model 4100 load operates at full current
from 2.1 to 450 V. To meet newer low voltage require-
ments, the Model 4110 load operates down to 0.7 V
and at reduced current down to 0.1 V. In the constant-
current mode, both loads have three ranges in order to
assure the necessary low-end resolution for both set
and measurement values.
PARALLELED “VIRTUAL” LOADS
To address higher power requirements, the same
type (4100 or 4100s) can be paralleled in software
to respond as if they were a single larger load. All
load functions, including slew rate and short-circuit,
are then internally synchronized so that the supply-
under-test sees a single “virtual” load without the
dynamic discontinuities associated with paralleling
older designs. Should the next application require a
different load grouping, reconfiguration is quickly
achieved through reprogramming, thus extending
the system’s flexibility with a minimum of load
modules.
OPERATION BELOW 1 VOLT
With the clear trend toward lower IC voltages,
today’s loads must anticipate tomorrow’s test
requirements. Both the 4100 and the 4110 will oper-
ate below 1 V at reduced current levels, with the
latter being optimized for operation at these very
low voltages.
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