SM5006 series
5006×K series
V
DD
= 4.5 to 5.5V, V
SS
= 0V, Ta =
−40
to 85°C unless otherwise noted.
Rating
Parameter
Symbol
Condition
min
SM5006AKAS, CF5006AKA
SM5006AKBS, CF5006AKB
SM5006AKCS, CF5006AKC
SM5006CKDS, CF5006CKD
SM5006DKCS, CF5006DKC
SM5006AKDS, CF5006AKD
SM5006BKCS, CF5006BKC
LOW-level output voltage
Output leakage current
HIGH-level input voltage
LOW-level input voltage
V
OL
I
Z
V
IH
V
IL
Q: Measurement cct 2, V
DD
= 4.5V, I
OL
= 16mA
Q: Measurement cct 2, INHN = LOW,
V
DD
= 5.5V
INHN
INHN
f = 30MHz
f = 40MHz
f = 60MHz,
Ta = –15 to 75°C
f = 60MHz,
Ta = 0 to 70°C
f = 70MHz,
Ta = –20 to 80°C
f = 70MHz,
Ta = –15 to 75°C
f = 70MHz,
Ta = 0 to 70°C
INHN pull-up resistance
R
UP
Measurement cct 4
SM5006AKAS, CF5006AKA
SM5006AKBS, CF5006AKB
Feedback resistance
R
f
Measurement cct 5
SM5006AKCS, CF5006AKC
SM5006AKDS, CF5006AKD
SM5006CKDS, CF5006CKD
Built-in resistance
R
G
R
D
Built-in capacitance
C
G
C
D
Design value, determined by the R
f
value
Design value, determined by the R
f
value
Design value. A monitor pattern on a wafer is tested.
Design value. A monitor pattern on a wafer is tested.
SM5006AKAS
CF5006AKA
SM5006AKBS
CF5006AKB
CF5006AKC
CF5006DKC
SM5006AKCS
SM5006DKCS
CF5006AKD
CF5006BKC
CF5006CKD
SM5006AKDS
SM5006BKCS
SM5006CKDS
V
OH
= V
DD
V
OL
= V
SS
typ
max
Unit
HIGH-level output voltage
V
OH
Q: Measurement cct 1,
V
DD
= 4.5V,
I
OH
= 16mA
3.9
4.2
–
V
4.0
–
–
–
2.0
–
–
–
–
–
–
–
4.2
0.3
–
–
–
–
16
18
25
25
35
35
–
0.4
10
µA
10
–
0.8
32
36
50
50
70
70
V
V
V
Current consumption
I
DD
INHN = open,
Measurement cct 3,
load cct 1,
V
DD
= 4.5 to 5.5V,
C
L
= 15pF
mA
–
50
6.97
4.76
4.16
2.21
17
17
7.44
14.88
35
–
8.2
5.6
4.9
2.6
20
20
8
16
70
150
9.43
6.44
5.64
2.99
23
23
8.56
pF
17.12
Ω
kΩ
kΩ
SEIKO NPC CORPORATION —9
NPC [ NIPPON PRECISION CIRCUITS INC ]
