5076 series
Measurement circuit
Current Consumption
5
4
IDD
A
VDD
XT
Crystal
3
XTN
VC
Q
2
1
0
CLOUT = 15pF
VC = 0V
0.1µF
VC = 0.5VDD
VC = VDD
VSS
VC = 0V
VC = 0.5VDD
VC = VDD
CLOUT = No load
1.7
1.6
1.8
1.9
2.0
VDD [V]
f
= 27MHz, Ta = R.T.
OUT
Frequency Stability by Supply Voltage Change
Measurement circuit
3.0
2.0
VDD
XT
Crystal
1.0
XTN
VC
Q
0.1µF
VC = 0V
VC = 1.8V
VC = 0.9V
0.0
−1.0
−2.0
−3.0
CLOUT = 15pF
(Including probe
capacitance)
VSS
1.6
1.7
1.8
1.9
2.0
VDD [V]
f
= 27MHz, 0ppm at V = 1.8V
DD
OUT
Measurement circuit
Drive Level
30
25
20
VDD
0.1µF
Crystal
XT
Tektronix CT-6
XTN
VC
Q
Current Probe
IX'tal
15
10
5
CLOUT = 15pF
VSS
0
2
0.0
0.3
0.6
0.9
1.2
1.5
1.8
DL = (I ) × Re
X’tal
DL: drive level
VC [V]
I
: current flowing to crystal (RMS value)
Re: crystal effective resistance
X’tal
V
= 1.8V, f
= 27MHz, Ta = R.T.
OUT
DD
SEIKO NPC CORPORATION —10
NPC [ NIPPON PRECISION CIRCUITS INC ]
