欢迎访问ic37.com |
会员登录 免费注册
发布采购

54ABT646J-QML 参数 Datasheet PDF下载

54ABT646J-QML图片预览
型号: 54ABT646J-QML
PDF下载: 下载PDF文件 查看货源
内容描述: 八进制收发器和寄存器与3态输出 [OCTAL TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS]
分类和应用: 总线驱动器总线收发器触发器逻辑集成电路输出元件信息通信管理
文件页数/大小: 9 页 / 25 K
品牌: NSC [ NATIONAL SEMICONDUCTOR ]
 浏览型号54ABT646J-QML的Datasheet PDF文件第2页浏览型号54ABT646J-QML的Datasheet PDF文件第3页浏览型号54ABT646J-QML的Datasheet PDF文件第4页浏览型号54ABT646J-QML的Datasheet PDF文件第5页浏览型号54ABT646J-QML的Datasheet PDF文件第6页浏览型号54ABT646J-QML的Datasheet PDF文件第7页浏览型号54ABT646J-QML的Datasheet PDF文件第8页浏览型号54ABT646J-QML的Datasheet PDF文件第9页  
MICROCIRCUIT DATA SHEET
MN54ABT646-X REV 0B0
Original Creation Date: 08/25/95
Last Update Date: 10/05/98
Last Major Revision Date: 03/19/97
OCTAL TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
General Description
The ABT646 consists of bus tranceiver circuits wit TRI-STATE, D-type flip-flops, and
control circuitry arranged for multiplexed transmission of data directly from the input
bus or from the internal registers. Data on the A or B bus will be clocked into the
registers as the appropriate clock pin goes to a high logic level. Control OE and
direction pins are provided to control the transceiver function. In the transceiver mode,
data present at the high impedance port may be stored in either the A or the B register or
in both. The select controls can mutiplex stored and real-time (transparent mode) data.
The direction control determines which bus will receive data when the enable control OE is
Active LOW. In the isolation mode (control OE HIGH), A data may be stored in the B
register and/or B data may be stored in the A register.
Industry Part Number
54ABT646
NS Part Numbers
54ABT646E-QML *
54ABT646J-QML **
54ABT646W-QML ***
Prime Die
NB646
Controlling Document
See Features Page
Processing
MIL-STD-883, Method 5004
Subgrp Description
1
2
3
4
5
6
7
8A
8B
9
10
11
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp (
o
C)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
Quality Conformance Inspection
MIL-STD-883, Method 5005
1