TIC116 SERIES
SILICON CONTROLLED RECTIFIERS
Copyright © 2000, Power Innovations Limited, UK
APRIL 1971 - REVISED JUNE 2000
G
G
G
G
G
8 A Continuous On-State Current
80 A Surge-Current
Glass Passivated Wafer
400 V to 800 V Off-State Voltage
Max I
GT
of 20 mA
K
A
G
1
2
3
TO-220 PACKAGE
(TOP VIEW)
Pin 2 is in electrical contact with the mounting base.
MDC1ACA
absolute maximum ratings over operating case temperature (unless otherwise noted)
RATING
TIC116D
Repetitive peak off-state voltage
TIC116M
TIC116S
TIC116N
TIC116D
Repetitive peak reverse voltage
TIC116M
TIC116S
TIC116N
Continuous on-state current at (or below) 70°C case temperature (see Note 1)
Average on-state current (180° conduction angle) at (or below) 70°C case temperature
(see Note 2)
Surge on-state current at (or below) 25°C case temperature (see Note 3)
Peak positive gate current (pulse width
≤
300
µs)
Peak gate power dissipation (pulse width
≤
300
µs)
Average gate power dissipation (see Note 4)
Operating case temperature range
Storage temperature range
Lead temperature 1.6 mm from case for 10 seconds
I
T(RMS)
I
T(AV)
I
TM
I
GM
P
GM
P
G(AV)
T
C
T
stg
T
L
V
RRM
V
DRM
SYMBOL
VALUE
400
600
700
800
400
600
700
800
8
5
80
3
5
1
-40 to +110
-40 to +125
230
A
A
A
A
W
W
°C
°C
°C
V
V
UNIT
NOTES: 1. These values apply for continuous dc operation with resistive load. Above 70°C derate linearly to zero at 110°C.
2. This value may be applied continuously under single phase 50 Hz half-sine-wave operation with resistive load. Above 70°C derate
linearly to zero at 110°C.
3. This value applies for one 50 Hz half-sine-wave when the device is operating at (or below) the rated value of peak reverse voltage
and on-state current. Surge may be repeated after the device has returned to original thermal equilibrium.
4. This value applies for a maximum averaging time of 20 ms.
PRODUCT
INFORMATION
1
Information is current as of publication date. Products conform to specifications in accordance
with the terms of Power Innovations standard warranty. Production processing does not
necessarily include testing of all parameters.