PO49FCT32803
3.3V 1:7 CMOS Clock Buffered Driver
11/22/05
500MHz TTL/CMOS Potato Chip
Maximum Ratings
Description
Storage Temperature
Operation Temperature
Operation Voltage
Input Voltage
Max
Unit
Note:
stresses greater than listed under
Maximum
Ratings
may
cause
-65 to 150
°C
°C
V
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
-40 to 85
-0.5 to +4.6
-0.5 to Vcc+0.5
-0.5 to Vcc+0.5
V
Output Voltage
V
DC Electrical Characteristics
Symbol
Description
Output High voltage
Output Low voltage
Input High voltage
Input Low voltage
Input High current
Input Low current
Clamp diode voltage
Series Resistor
Test Conditions
Vcc=3V Vin=VIH or VIL, IOH= -8mA
Vcc=3V Vin=VIH or VIL, IOH=12mA
Guaranteed Logic HIGH Level (Input Pin)
Guaranteed Logic LOW Level (Input Pin)
Vcc = 3.6V and Vin = 3.6V
Min
Typ Max
Unit
VOH
VOL
VIH
VIL
IIH
2.4
3
0.4
-
-
V
V
-
0.5
Vcc
0.8
1
2
V
-0.5
-
V
-
-
-
-
uA
uA
V
Vcc = 3.6V and Vin = 0V
IIL
-
-1
Vcc = Min. And IIN = -18mA
VIK
Rs
-0.7 -1.2
22
Ω
Notes:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, 25 °C ambient.
3. This parameter is guaranteed but not tested.
4. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
5. VoH = Vcc – 0.6V at rated current
2
Copyright © 2005, Potato Semiconductor Corporation
POTATO [ POTATO SEMICONDUCTOR CORPORATION ]
