PO74HSTL85353A
www.potatosemi.com
LVCMOS and XTAL Input to HSTLOutput 1:4 Fanout Buffer
300MHz HSTL Potato Chip
Power Supply Characteristics
Symbol
Description
Quiescent Power Supply Current
Test Conditions (1)
Vcc=Max, Vin=Vcc or GND
Min
Typ
Max
Unit
Icc
Q
Notes:
1.
2.
3.
4.
-
0.1
30
uA
For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
Typical values are at Vcc = 3.3V, 25°C ambient.
This parameter is guaranteed but not tested.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
Crystal Oscillator Test Conditions
Te s t C o n d it io n s
Output Frequency
3.579
14.318
28
50
250
Un its
X1=3.579MHz, C4=100pf, C5=100pf
X1=14.318MHz, C4=50pf, C5=50pf
X1=28MHz, C4=50pf, C5=50pf, R1=5.1K
X1=50MHz, C4=50pf, C5=50pf, R1=3K
X1=250MHz, C4=0, C5=0, R1=1K
See schematic example.
MHz
MHz
MHz
MHz
MHz
Notes:
Switching Characteristics
Symbol
Description
Propagation Delay CLKA or CLKB to Output pair
Test Conditions (1)
CL = 15pF
0.8V – 2.0V
CL = 15pF, 125MHz
CL = 15pF, 125MHz
CL =15pF
M ax
Unit
t
PD
tr/tf
tsk(o)
tsk(pp)
fmax
Notes:
3.4
0.8
50
350
300
250
ns
ns
ps
ps
MHz
Rise/Fall Time
Output Pin to Pin Skew (Same Package)
Output Skew (Different Package)
Input Frequency
1. See test circuits and waveforms.
2. tpLH, tpHL, tsk(p), and tsk(o) are production tested. All other parameters guaranteed but not production tested.
3. Airflow of 1m/s is recommended for frequencies above 133MHz
Potato Semiconductor Corporation
4
01/01/10
POTATO [ POTATO SEMICONDUCTOR CORPORATION ]
