PACE1754
DC ELECTRICAL SPECIFICATIONS
(Over recommended operating conditions)
Symbol
V
IH
V
IL
V
CD
V
OH
V
OL
V
OL
I
IH
Parameter
Input HIGH Voltage
Input LOW Voltage
Input Clamp Diode Voltage
Output HIGH Voltage
Output LOW Voltage,
except A
0
– A
15
Output LOW Voltage,
A
0
– A
15
Input HIGH Current,
except IB
0
– IB
15
, parity/IB
16
,
SING ERR, A
0
/EXT AD
0
,
A
1
/EXT AD
1
, STRBA
Input HIGH Current,
IB
0
– IB
15
, parity/IB
16
,
A
0
/EXT AD
0
, A
1
/EXT AD
1
Input HIGH Current,
STRBA, SING ERR
Input LOW Current,
except IB
0
– IB
15
, parity/IB
16
,
SING ERR, A
0
/EXT AD
0
,
A
1
/EXT AD
1
,
STRBD, TEST ON
Input LOW Current,
IB
0
– IB
15
, parity/IB
16
, SING ERR,
A
0
/EXT AD
0
, A
1
/EXT AD
1
Input LOW Current,
STRBD, TEST ON
Output Three-State Current
Output Three-State Current
Quiescent Power
Supply Current
(CMOS Input Levels)
Quiescent Power
Supply Current
(TTL Input Levels)
Dynamic Power
I
CCD
I
OS
C
IN
C
OUT
Supply Current
f = 20MHz
f = 30MHz
f = 40MHz
Output Short Circuit Current
2
Input Capacitance
Output/Bi-directional
Capacitance
–25
10
15
2.4
V
CC
– 0.2
0.5
0.2
0.5
0.2
10
Min
2.0
–0.5
Max
V
CC
+ 0.5
0.8
–1.2
Unit
V
V
V
V
V
V
V
V
V
µA
V
CC
= 4.5V, I
IN
= –18mA
V
CC
= 4.5V,
V
IN
= 0.8V, 2.0V
V
CC
= 4.5V,
V
IN
= 0.8V, 2.0V
V
CC
= 4.5V,
V
IN
= 0.8V, 2.0V
V
IN
= V
CC
,
V
CC
= 5.5V
V
IN
= V
CC
,
V
CC
= 5.5V
V
IN
= V
CC
,
V
CC
= 5.5V
V
IN
= GND,
V
CC
= 5.5V
V
IN
= GND,
V
CC
= 5.5V
V
IN
= GND,
V
CC
= 5.5V
V
OUT
= 2.4V, V
CC
= 5.5V
V
OUT
= 0.5V, V
CC
= 5.5V
V
IN
< 0.2V or > V
CC
– 0.2V
f = 0MHz, Outputs Open,
V
CC
= 5.5V
V
IN
= 3.4V, f = 0MHz,
All Inputs, Outputs Open,
V
CC
= 5.5V
V
IN
= 0V to V
CC
,
tr = tf = 2.5 ns typ.,
Outputs Open, V
CC
= 5.5V
V
OUT
= GND, V
CC
= 5.5V
Inputs Only
Outputs Only
(Including I/O Buffers)
I
OH
= –8.0mA
I
OH
= –300µA
I
OL
= 8.0mA
I
OL
= 300µA
I
OL
= 20.0mA
I
OL
= 300µA
Conditions
1
I
IH
I
IH
I
IL
50
µA
500
–10
µA
µA
I
IL
I
IL
I
OZH
I
OZL
I
CCQC
–50
–500
50
–50
10
µA
µA
µA
µA
mA
I
CCQT
50
40
50
60
mA
mA
mA
mA
mA
pF
pF
Notes:
1. 4.5V
≤
V
CC
≤
5.5V, –55°C
≤
T
C
≤
+125°C. Unless otherwise specified, testing shall be conducted at worst-case conditions.
2. Duration of the short should not exceed one second; only one output may be shorted at a time.
Document #
MICRO-5
REV C
Page 3 of 20
PYRAMID [ PYRAMID SEMICONDUCTOR CORPORATION ]
