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P93U422-35CMB 参数 Datasheet PDF下载

P93U422-35CMB图片预览
型号: P93U422-35CMB
PDF下载: 下载PDF文件 查看货源
内容描述: HIGH SPEED 256 ×4的静态CMOS RAM [HIGH SPEED 256 x 4 STATIC CMOS RAM]
分类和应用: 存储内存集成电路静态存储器
文件页数/大小: 10 页 / 217 K
品牌: PYRAMID [ PYRAMID SEMICONDUCTOR CORPORATION ]
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P93U422
MAXIMUM RATINGS
(1)
Symbol
V
CC
Parameter
Power Supply Pin with
Respect to GND
Terminal Voltage with
Respect to GND
(up to 7.0V)
Operating Temperature
Value
– 0.5 to +7
– 0.5 to
V
CC
+0.5
– 55 to +125
Unit
V
Symbol
T
BIAS
T
STG
I
OUT
Parameter
Temperature Under
Bias
Storage Temperature
DC Output Current
Value
– 55 to +125
– 65 to +150
20
Unit
°C
°C
mA
V
TERM
T
A
V
°C
RECOMMENDED OPERATING CONDITIONS
Grade
(2)
Commercial
Military
Ambient Temp
0°C to 70°C
–55°C to 125°C
Gnd
0V
0V
Vcc
5.0V ±10%
5.0V ±10%
CAPACITANCES
(4)
(V
CC
= 5.0V, T
A
= 25°C, f = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
Input Capacitance
Conditions Typ. Unit
V
IN
= 0V
5
7
pF
pF
Output Capacitance V
OUT
= 0V
DC ELECTRICAL CHARACTERISTICS
Over recommended operating temperature and supply voltage
(2)
Symbol
V
OH
V
OL
V
IH
V
IL
I
IL
I
IH
I
SC
I
CC
Parameter
Output High Voltage
Output Low Voltage
Input High Level
Input Low Level
Input Low Current
Input High Current
Output Short Circuit Current
(3)
Power Supply Current
V
IN
= 0.40 V
V
CC
= Max, V
IN
= 4.5V
V
CC
= Max., V
OUT
= 0.0V
All Inputs = GND
V
CC
= Max.
I
IN
= –10mA
V
OUT
= 2.4V, V
CC
= Max.
V
OUT
= 0.5V, V
CC
= Max.
–50
T
A
= 125°C
T
A
= 75°C
T
A
= 0°C
T
A
= –55°C
V
CL
I
CEX
Input Clamp Voltage
Output Leakage Current
Test Conditions
V
CC
= Min., V
IN
= V
IH
or V
IL
, I
OH
= –5.2 mA
V
CC
= Min., V
IN
= V
IH
or V
IL
, I
OL
= 8.0 mA
2.1
0.8
–300
40
–70
70
70
80
90
–1.5
50
V
µA
mA
2.4
0.45
P93U422
Min.
Max.
Unit
V
V
V
V
µA
µA
mA
Notes:
1. Stresses greater than those listed under MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above
those indicated in the operational sections of this specification is not
implied. Exposure to MAXIMUM rating conditions for extended periods
may affect reliability
2. Extended temperature operation guaranteed with 400 linear feet per minute
of air flow.
3. For test purposes, not more than one output at a time should be shorted. Short
circuit test duration should not exceed 30 seconds.
4. This parameter is sampled and not 100% tested.
Document #
SRAM102
REV A
Page 2 of 10