RT8800/B
Parameter
Reference Voltage
Reference Voltage
DACFB Sourcing Capability
Error Amplifier
DC Gain
Gain-Bandwidth Product
Slew Rate
Current Sense GM Amplifier
Recommended Full Scale Source Current
OCP trip level
Protection
Over-Voltage Trip (V
FB
- V
DACQ
)
Power Good
PGOOD Output Low Voltage
PGOOD Delay
V
PGOOD
I
PGOOD
= 4mA
--
4
--
--
0.2
8
V
ms
--
500
--
mV
I
OCP
--
160
100
190
--
220
μA
μA
GBW
SR
C
L
= 10pF
C
L
= 10pF
--
--
--
65
10
8
--
--
--
dB
MHz
V/μs
V
DACFB
0.79
--
0.8
--
0.81
10
V
mA
Symbol
Test Conditions
Min
Typ
Max
Units
T
PGOOD_Delay
90% * V
OUT
to PGOOD_H
Note 1.
Stresses listed as the above "Absolute Maximum Ratings" may cause permanent damage to the device. These are for
stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended
periods may remain possibility to affect device reliability.
Note 2.
Devices are ESD sensitive. Handling precaution recommended.
Note 3.
The device is not guaranteed to function outside its operating conditions.
Note 4.
θ
JA
is measured in the natural convection at T
A
= 25°C on a low effective thermal conductivity test board of
JEDEC 51-3 thermal measurement standard.
All brand name or trademark belong to their owner respectively
www.richtek.com
10
DS8800/B-06 March 2007
RICHTEK [ RICHTEK TECHNOLOGY CORPORATION ]
