■ TEST CIRCUITS
5.0V
470K
I
SS
VDD
V
DD
R3111
Series
X
VOUT
V
IN
R3111
Series
X
VIN
OUT
OUT
GND
GND
*Pull-up circuit is not necessary for
CMOS Output type, or R3111XXXXC
.
Figure 3. Supply Current Test Circuit
Figure 4. Detector Threshold Test Circuit
VDS
VDD
VDD
I
OUT
IOUT
R3111
Series
X
R3111X
Series
VIN
VIN
OUT
OUT
VDD- VDS
VDS
GND
GND
*Apply only to CMOS
Figure 5. Nch Driver Output Current Test Circuit
Figure 6. Pch Driver Output Current Test Circuit
+5.0V
+5.0V
OUT
R
100K
IN
+VDET+2.0V
0.7V
+VDET+2.0V
0.7V
V
DD
R
470K
OUT
R
470K
OUT
R3111XXX1A
Series
R3111XXX1A
Series
DD
V
SS
V
SS
OUT
P.G.
P.G.
OUT
V
OUT
CIN
GND
GND
COUT
V
SS
VSS
Figure 7. Output Delay Time Test Circuit (1)
Figure 8. Output Delay Time Test Circuit (2)
Rev.1.10
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RICOH [ RICOH ELECTRONICS DEVICES DIVISION ]
