s
TEST CIRCUITS
I
SS
V
DD
5.0V
V
DD
R3111
X
Series
GND
V
IN
R3111
X
Series
GND
470K
V
OUT
OUT
V
IN
OUT
*Pull-up circuit is not necessary for
CMOS Output type, or R3111XXXXC.
Figure 3. Supply Current Test Circuit
Figure 4. Detector Threshold Test Circuit
V
DS
I
OUT
V
IN
R3111
X
Series
GND
*Apply only to CMOS
V
DD
R3111
X
Series
GND
I
OUT
OUT
V
DS
V
DD
V
IN
OUT
V
DD-
V
DS
Figure 5. Nch Driver Output Current Test Circuit
+5.0V
+V
DET
+2.0V
0.7V
V
SS
V
DD
R3111
XXX
1A
Series
OUT
GND
C
OUT
V
SS
R
OUT
470K
OUT
Figure 6. Pch Driver Output Current Test Circuit
+5.0V
R
OUT
470K
OUT
+V
DET
+2.0V
0.7V
V
SS
R
IN
100K
R3111
XXX
1A
Series
OUT
GND
P.G.
P.G.
V
DD
C
IN
V
SS
Figure 7. Output Delay Time Test Circuit (1)
Figure 8. Output Delay Time Test Circuit (2)
Rev.1.10
- 11 -
RICOH [ RICOH ELECTRONICS DEVICES DIVISION ]
