s
TEST CIRCUITS
*Pull-up circuit is not necessary for CMOS Output type, or R3112XXXXC.
Supply Current Test Circuit
Detector Threshold Test Circuit
I
SS
V
DD
V
DD
R3112X
Series
GND
Nch Driver Output Current Test Circuit
+5V or
V
DD
470kΩ
V
IN
R3112
Series
GND
OUT
Pch Driver Output Current Test Circuit
*Apply only to
CMOS
V
DD
V
IN
R3112
Series
GND
CD Pin Threshold Test Circuit
I
OUT
V
IN
OUT
V
DS
V
DD
R3112X
Series
GND
CD Pin Output Current Test Circuit
I
OUT
OUT
V
DD
+V
DS
+5V or V
DD
V
DD
V
IN
CD
V
DS
R3112X
Series
GND
Output Delay Time Test Circuit
V
DD
I
CD
C
D
R3112X
Series
GND
470kΩ
OUT
V
IN
V
DS
+V
DET
+2.0V or 6.0V
Input
Voltage
V
DD
0.7V
GND
100%
Output Voltage
50%
GND
V
IN
C
D
R3112X
Series
GND
+5V
470kΩ
C
D
OUT
Rev. 1.10
-7-
RICOH [ RICOH ELECTRONICS DEVICES DIVISION ]
