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62256 参数 Datasheet PDF下载

62256图片预览
型号: 62256
PDF下载: 下载PDF文件 查看货源
内容描述: 32Kx8位低功耗CMOS静态RAM [32Kx8 bit Low Power CMOS Static RAM]
分类和应用:
文件页数/大小: 9 页 / 161 K
品牌: SAMSUNG [ SAMSUNG SEMICONDUCTOR ]
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KM62256C Family
PRODUCT LIST
Commercial Temp Product
(0~70°C)
Part Name
KM62256CLP-5
KM62256CLP-5L
KM62256CLP-7
KM62256CLP-7L
KM62256CLG-5
KM62256CLG-5L
KM62256CLG-7
KM62256CLG-7L
KM62256CLTG-5L
KM62256CLTG-7L
KM62256CLRG-5L
KM62256CLRG-7L
CMOS SRAM
Extended Temp Products
(-25~85°C)
Part Name
Function
28-SOP, 70ns, L-pwr
28-SOP, 70ns, LL-pwr
28-TSOP F, 70ns, LL-pwr
28-TSOP R, 70ns, LL-pwr
Industrial Temp Products
(-40~85°C)
Part Name
KM62256CLGI-7
KM62256CLGI-7L
KM62256CLTGI-7L
KM62256CLRGI-7L
Function
Function
28-SOP, 70ns, L-pwr
28-SOP, 70ns, LL-pwr
28-TSOP F, 70ns, LL-pwr
28-TSOP R, 70ns, LL-pwr
KM62256CLGE-7
28-DIP, 55ns, L-pwr
KM62256CLGE-7L
28-DIP, 55ns, LL-pwr
KM62256CLTGE-7L
28-DIP, 70ns, L-pwr
KM62256CLRGE-7L
28-DIP, 70ns, LL-pwr
28-SOP, 55ns, L-pwr
28-SOP, 55ns, LL-pwr
28-SOP, 70ns, L-pwr
28-SOP, 70ns, LL-pwr
28-TSOP F, 55ns, LL-pwr
28-TSOP F, 70ns, LL-pwr
28-TSOP R, 55ns, LL-pwr
28-TSOP R, 70ns, LL-pwr
Note : LL means Low Low standby current.
FUNCTIONAL DESCRIPTION
CS
H
L
L
L
1. X means don′t care
OE
X
H
L
X
WE
X
H
H
L
I/O Pin
High-Z
High-Z
Dout
Din
Mode
Deselected
Output Disabled
Read
Write
Power
Standby
Active
Active
Active
ABSOLUTE MAXIMUM RATINGS
Item
Voltage on any pin relative to Vss
Voltage on Vcc supply relative to Vss
Power Dissipation
Storage temperature
1)
Symbol
V
IN
,V
OUT
V
CC
P
D
T
STG
Ratings
-0.5 to V
CC
+0.5
-0.5 to 7.0
1.0
-65 to 150
0 to 70
Unit
V
V
W
°C
°C
°C
°C
-
Remark
-
-
-
-
KM62256CL
KM62256CLE
KM62256CLI
-
Operating Temperature
T
A
-25 to 85
-40 to 85
Soldering temperature and time
T
SOLDER
260°C, 10sec(Lead Only)
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional oper
ation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect d vice reliability.
e
3
Revision 4.0
December 1997