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CS1005C0G104C100NRA 参数 Datasheet PDF下载

CS1005C0G104C100NRA图片预览
型号: CS1005C0G104C100NRA
PDF下载: 下载PDF文件 查看货源
内容描述: 多层陶瓷电容器 [Multi Layer Ceramic Capacitors]
分类和应用: 电容器陶瓷电容器
文件页数/大小: 14 页 / 769 K
品牌: SAMWHA [ SAMWHA ELECTRIC ]
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SMD Type
Multi Layer Ceramic Capacitors
www.samwha.com
22
Characteristic
No.
8
Item
Temperature Appearance
Cycle
Temperature
Compensating Type
No marking defects
X7R, X5R : Within
±7.5%
Y5V
: Within
±20%
Char. 50V Min. 25V
X7R
X5R
Y5V
16V
10V
6.3V
High Dielectric Constant Type
Test Methods
and Conditions
Perform the five cycless according
to the four heat treatments listed in
the following table.
Step
1
2
3
4
Min.
Max.
Temp. Operating Room Operating Room
(℃) Temp. Temp.
Temp.
Temp.
+0, -3
+3, -0
Time
2 to 3
30±3 2 to 3
(Min) 30±3
Characteristic
No.
Item
Temperature
Compensating Type
High Dielectric Constant Type
Test Methods
and Conditions
- Substrate Material :
Glass EPOXY Board
- Board Thickness :
1.6mm
0.8mm(0603/1005size)
Test Condition
- Bending Limit : 1mm
- Pressurizing Speed : 1mm/sec
11 Bending
Strength
Capacitance Within
±2.5%
or
±0.25㎊
Change
(whichever is larger)
Dissipation
Factor
(or Q)
30㎊ Min. :
Q≥1,000 (DF≤0.1%)
30㎊ Max. :
Q≥400+20C
(DF≤1/(400+20C))
≤5%/ ≤5%/ ≤5%/ ≤7.5%/ ≤7.5%/
≤7.5% ≤10% ≤10% ≤12.5% ≤12.5%
≤7.5%/ ≤10%/ ≤12.5% ≤15%/
≤20%
≤12.5% ≤12.5% ≤15% ≤20%
I.R.
.F
More than 10,000
MΩ
or 500
(Whichever is smaller)
No marking defects
X7R, X5R : Within
±12.5%
Y5V
: Within
+30%,
-40%
(Y5V/1.0㎌, 2.2㎌, 4.7㎌/10V)
Within
±30%
(others)
Char. 50V Min. 25V
X7R
X5R
Y5V
16V
10V
6.3V
- Initial measurement
Perform a heat treatment at 150+0,
-10℃ for one hour and then let sit
for 48±4 hours at room temperature.
- Measurement after test
Take it out and set it for 24±2 hours
(temperature compensating) or
48±4 hours(high dielectric constant
type) at room temperature, then
measure.
- Temperature : 40±2℃
- Humidity : 90~95%
- Hour : 500±12hrs
- Test Voltage : The rated voltage
- Take it out and set it for 24±2 hours
(temperature compensating) or
48±4 hours(high dielectric constant
type) at room temperature, then
measure.
The charge/discharge current is
less than 50mA
No cracking or marking defects shall occur
Capacitance Within
±5%
or
±0.5㎊
Change
(whichever is larger)
X7R, X5R : Within
±12.5%
Y5V
: Within
±30%
Shown in Fig. After soldering and
then let sit for 24+4hr(temperature
compensating type), 48±4hr (high
dielectric constant type) at room
temperature.
The capacitor should be subjected
to a simple harmonic motion having
a total amplitude of 1.5mm, the
frequency being varied uniformly
between the approximate limits of
10 and 55Hz, shall be traversed(from
10Hz to 55Hz then 10Hz again) in
approximately 1 minute.
This motion shall be applied for a
period of 2 hours in each 3mutually
perpendicular directions(total is
6hours).
9
Humidity
Load
Appearance
Capacitance Within
±7.5%
or
±0.75㎊
Change
(whichever is larger)
12 Vibration Appearance No defects or abnormalities
Resistance
Capacitance Whin the specified tolerance
Q/DF
30㎊ Min. :
Q 1,000 (DF 0.1%)
30㎊ Max. :
Q 400+20C
(DF 1/ (400+20C))
Char. 50V Min. 25V
16V
10V
6.3V
X7R
≤2.5%/ ≤3%/ ≤3.5%/ ≤5%/ ≤5%/
X5R
≤5% ≤7% ≤7% ≤10% ≤10%
Y5V
≤5%/ ≤7%/
≤9% ≤9%
≤9% ≤12.5%/
≤15%
≤12.5% ≤15%
Dissipation
Factor
(or Q)
30㎊ Min. :
Q≥200 (DF≤0.5%)
30㎊ Max. :
Q≥100
+10/3C
(DF≤1/(100+10/3C))
≤5%/ ≤5%/ ≤5%/ ≤7.5%/ ≤7.5%/
≤7.5% ≤10% ≤10% ≤12.5% ≤12.5%
≤7.5%/ ≤10%/ ≤12.5% ≤15%/
≤20%
≤12.5% ≤12.5% ≤15% ≤20%
I.R.
Appearance
10 High
Temperature
Capacitance
Load
Change
More than 500
MΩ
or 25
(Whichever is smaller)
.F
No marking defects
Within
±3%
or
±0.3㎊
(whichever is larger)
X7R, X5R : Within
±12.5%
Y5V
: Within
±30%(Cap.
< 1.0㎌)
Within
+30%, -40%
(Cap.
1.0㎌)
Char. 50V Min. 25V
16V
10V
6.3V
- Testing time : 1000±12hrs
- Applied voltage :
Rated voltage < DC250V :
×200%
- Temperature :
C0G, X7R
125±3℃
X5R , Y5V
85±3℃
- Measurement after test
Take it out and set it for 24±2
hours(temperature compensating
type)or 48±4 hours (high dielectric
constant type) at room temperature,
then measure.
The charge/discharge current is
less than 50mA.
13 Humidity
Steady
State
Appearance No marking defects
Capacitance Within
±5%
or
±0.5㎊
Change
(whichever is larger)
Dissipation
(or Q)
30㎊ Min. :
Q≥350 (DF≤0.3%)
10㎊≤Cp
≤30㎊ :
Q≥275 +5/2C
(DF≤1/(275+5/2C))
10㎊ Max. :
Q≥200+10C
(DF≤1/(200+10C))
I.R
X7R, X5R : Within
±12.5%
Y5V
: Within
±30%
Char. 50V Min. 25V
X7R
X5R
Y5V
16V
10V
6.3V
- Temperature : 40±2℃
- Humidity : 90~95%
- Hour : 500±12hours
- Measurement after test
Take it out and set it for 24±2 hours
(temperature compensating type) or
48±4 hours(high dielectric constant
type) at room temperature, then
measure.
Dissipation
Factor
(or Q)
30㎊ Min. :
Q≥350 (DF≤0.3%)
10㎊≤Cp
≤30㎊ :
Q≥275 +5/2C
(DF≤1/(275+5/2C))
10㎊ Max. :
Q≥200+10C
(DF≤1/(200+10C))
X7R
≤5%/ ≤5%/ ≤5%/ ≤7.5%/ ≤7.5%/
X5R
≤7.5% ≤10% ≤10% ≤12.5% ≤12.5%
≤7.5%/ ≤10%/ ≤12.5% ≤15%/
Y5V
≤20%
≤12.5% ≤12.5% ≤15% ≤20%
≤5%/ ≤5%/ ≤5%/ ≤7.5%/ ≤7.5%/
≤7.5% ≤10% ≤10% ≤12.5% ≤12.5%
≤7.5%/ ≤10%/ ≤12.5% ≤15%/
≤20%
≤12.5% ≤12.5% ≤15% ≤20%
I.R.
More than 10,000
MΩ
or 50
(Whichever & Smaller)
.F
.F
More than 1,000
MΩ
or 50
(Whichever is Smaller)
SAMWHA CAPACITOR Co., Ltd.
Multi Layer Ceramic Capacitors
23