7. Reliability Tests
Item
Condition
Note
Failures
0/22
Life Test
Ta = RT, IF = 90mA
Ta = 85ºC, IF = 90mA
Ta = -30ºC, IF = 90mA
1000hrs
1000hrs
1000hrs
High Temperature
0/22
Operating
Low Temperature Operating
0/22
Ta = -30ºC (30min) ~ 85ºC (30min)
100
Thermal Shock
0/40
(Transfer time : 10sec, 1Cycle = 1hr)
cycles
Resistance to soldering
Heat
Ts = 255 ± 5ºC, t = 10sec
1kV, 1.5kΩ ; 100pF
1 time
1 time
0/22
ESD
0/22
(Human Body Model)
High Temperature Storage
Low Temperature Storage
Ta = 100ºC
Ta = -40ºC
1000hrs
1000hrs
1000hrs
0/22
0/22
0/22
Temperature Humidity
Storage
Ta = 85ºC, RH = 85%
Temperature Humidity
Operating
Ta = 85ºC, RH = 85%, IF = 90mA
100hrs
0/22
< Judging Criteria For Reliability Tests >
VF
IR
USL[1] X 1.2
USL X 2.0
LSL [2] X 0.7
ФV
Notes :
[1] USL : Upper Standard Level
[2] LSL : Lower Standard Level.
Rev. 00
September 2008
www.ZLED.com
Document No. : SSC-QP-7-07-24 (Rev.00)
SEOUL [ Seoul Semiconductor ]
