5. RELIABLITY TESTS
Item
Life Test
High Temperature
Operating
Low Temperature
Operating
Thermal Shock
Temperature Cycle
Moisture Resistance
Cycle
Resistance to soldering
Heat
ESD
(Human Body Model)
High Temperature
Storage
Low Temperature
Storage
Temperature Humidity
Storage
Temperature Humidity
Operating
Condition
T
a
= RT,
I
F
= 50mA
T
a
= 100ºC,
I
F
= 10mA
T
a
= -40ºC,
I
F
= 20mA
T
a
= -40ºC (30min) ~ 105º (30min)
(Transfer time : 5sec, 1Cycle = 1hr)
T
a
= -40ºC (25min) ~ 25ºC (5min) ~
105ºC (25min) ~ 25ºC (5min)
T
a
= 25ºC ~ 65ºC ~ -10ºC,
RH
= 90%
(1Cycle = 24hrs)
T
s
= 260
±
5ºC,
t
= 10
±
1sec
1kV, 1.5kΩ ; 100pF
T
a
= 105ºC
T
a
= -40ºC
T
a
= 85ºC,
RH
= 85%
T
a
= 85ºC,
RH
= 85%
I
F
= 15mA
Note
1000hrs
1000hrs
1000hrs
100cycles
100cycles
10cycles
1 time
1 time
1000hrs
1000hrs
1000hrs
100hrs
Failures
0/22
0/22
0/22
0/50
0/50
0/50
0/50
0/22
0/50
0/50
0/50
0/22
< Judging Criteria For Reliability Tests >
V
F
I
R
I
V
Notes : 1. USL : Upper Standard Level
<050201> Rev. 0.0
LI521
USL
1
X
1.2
USL
X
2.0
LSL
2
X
0.7
2. LSL : Lower Standard Level.
SEOUL SEMICONDUCTOR CO., LTD.
148-29, Kasan-Dong, Keumchun-Gu, Seoul, Korea
TEL : 82-2-3281-6269 FAX : 82-2-857-5430
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SEOUL [ Seoul Semiconductor ]
