BLUE LAMP LED
Reliability Tests
Item
Life Test
High Temperature Operating
Low Temperature Operating
Thermal Shock
Resistance to soldering Heat
ESD
(Human Body Model)
High Temperature Storage
Low Temperature Storage
Temperature Humidity
Storage
Temperature Humidity
Operating
LB520
Condition
T
a
= RT,
I
F
= 30mA
T
a
= 85ºC,
I
F
= 8mA
T
a
= -30ºC,
I
F
= 20mA
T
a
= -40ºC (30min) ~ 100º (30min)
(Transfer time : 10sec, 1Cycle = 1hr)
T
s
= 255
±
5ºC,
t
= 10sec
1kV, 1.5kΩ ; 100pF
T
a
= 100ºC
T
a
= -40ºC
T
a
= 85ºC,
RH
= 85%
T
a
= 85ºC,
RH
= 85%,
I
F
= 8mA
Note
1000hrs
1000hrs
1000hrs
100
cycles
1 time
1 time
1000hrs
1000hrs
1000hrs
100hrs
Failures
0/22
0/22
0/22
0/40
0/22
0/22
0/22
0/22
0/22
0/22
< Judging Criteria For Reliability Tests >
V
F
I
R
Ф
V
Notes :
[1] USL : Upper Standard Level
[2] LSL : Lower Standard Level.
USL
[1]
X 1.2
USL X 2.0
LSL
[2]
X 0.5
-4-
<070521> Rev. 0.3
서식번호 : QP-7-03-05 (Rev.00)
SEOUL [ Seoul Semiconductor ]
