5. RELIABILITY TESTS
Item
Life Test
High Temperature
Operating
Low Temperature
Operating
Thermal Shock
Resistance to soldering
Heat
ESD
(Human Body Model)
High Temperature
Storage
Low Temperature
Storage
Temperature Humidity
Storage
Temperature Humidity
Operating
Condition
T
a
= RT,
I
F
= 30mA
T
a
= 85ºC,
I
F
= 8mA
T
a
= -30ºC,
I
F
= 20mA
T
a
= -40ºC (30min) ~ 100º (30min)
(Transfer time : 5sec, 1Cycle = 1hr)
T
s
= 255
±
5ºC,
t
= 10sec
1kV, 1.5kΩ ; 100pF
T
a
= 100ºC
T
a
= -40ºC
T
a
= 85ºC,
RH
= 85%
T
a
= 85ºC,
RH
= 85%
I
F
= 8mA
Note
1000hrs
1000hrs
1000hrs
100cycles
1 time
1 time
1000hrs
1000hrs
1000hrs
100hrs
Failures
0/22
0/22
0/22
0/50
0/22
0/22
0/22
0/22
0/22
0/22
< Judging Criteria For Reliability Tests >
V
F
I
R
I
V
Notes : 1. USL : Upper Standard Level
USL
1
X
1.2
USL
X
2.0
LSL
2
X
0.5
2. LSL : Lower Standard Level.
<060712> Rev. 0.1
LB700D
SEOUL SEMICONDUCTOR CO., LTD.
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