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SGM2324YS 参数 Datasheet PDF下载

SGM2324YS图片预览
型号: SGM2324YS
PDF下载: 下载PDF文件 查看货源
内容描述: 为1MHz ,四路,通用CMOS运算放大器 [1MHz, Quad, General Purpose CMOS Operational Amplifier]
分类和应用: 运算放大器
文件页数/大小: 13 页 / 410 K
品牌: SGMICRO [ Shengbang Microelectronics Co, Ltd ]
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PACKAGE/ORDERING INFORMATION
MODEL
ORDER NUMBER
SGM2324YS/TR
SGM2324
SGM2324YTS/TR
SGM2324YS14/TR
SGM2324YTS14/TR
PACKAGE
DESCRIPTION
SO-16
TSSOP-16
SO-14
TSSOP-14
PACKAGE
OPTION
Tape and Reel, 2500
Tape and Reel, 3000
Tape and Reel, 2500
Tape and Reel, 3000
MARKING
INFORMATION
SGM2324YS
SGM2324YTS
SGM2324YS14
SGM2324YTS14
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V+ to V- . . . . . . . . . . . . . . . . . . . . . . . 6V
Storage Temperature Range . . . . . . . . . -65℃ to +150℃
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 160℃
Operating Temperature Range . . . . . . . . -40℃ to +85℃
Package Thermal Resistance @ T
A
= 25
SO-16,
θ
JA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
/W
TSSOP-16,
θ
JA
. . . . . . . . . . . . . . . . . . . . . . . . . . . 105
/W
Lead Temperature Range (Soldering 10 sec)
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260℃
ESD Susceptibility
HBM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4000V
MM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400V
CAUTION
This integrated circuit can be damaged by ESD. SG
Micro-electronics recommends that all integrated
circuits be handled with appropriate precautions.
Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance
degradation to complete device failure. Precision
integrated circuits may be more susceptible to
damage because very small parametric changes could
cause the device not to meet its published
specifications.
NOTES
1. Stresses above those listed under Absolute Maximum
Ratings may cause permanent damage to the device. This is
a stress rating only; functional operation of the device at
these or any other conditions above those indicated in the
operational section of this specification is not implied.
Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
3
SGM2324