PQ1Xxx1M2ZPH Series
Fig.2 Test Circuit for Ripple Rejection
+
1
ei
~
2
5
eo
V
IN
V
C
3
4
R
L
V
~
f=400Hz(sine wave)
ei(rms)=100mV
V
IN
=V
O
(TYP)+1.0V
V
C
=1.8V
I
O
=10mA
RR=20log(ei(rms)/eo(rms))
Fig.3
400
Power Dissipation vs. Ambient
Temperature
Fig.4
100
Relative output voltage (%)
Overcurrent Protection
Characteristics (Typical Value)
Power dissipation P
D
(mW)
300
75
200
50
100
25
0
-30 -25
0
25
50
75 85 100 125
150
0
0
T
a
=25°C
0.1
0.2
0.3
Output current I
O
(A)
0.4
Ambient temperature T
a
(°C)
Note) Oblique line portion:Overheat protection may operate in this area.
F i g.5 Output Voltage Fluctuation vs . Junction
Temperature (PQ1X301M2ZPH)(Typical Value)
60
V
IN
=3.8V
50
I
O
=30mA
V
C
=1.8V
40
C
O
=4.7μF
30
(Ceramic capacitor)
20
10
0
–10
–20
–30
–40
–50
–60
–30–20 0 20 40 60 80 100 120 140
Junction temperature T
j
(°C)
Output voltage fluctuation V
O
(mV)
Fig.6
4
Output Voltage vs. Input Voltage
(PQ1X301M2ZPH)(Typical Value)
Output voltage V
O
(V)
3
2
R
L
=
1
T
a
=25°C
C
IN
=1μF
(Ceramic capacitor)
C
O
=4.7μF
(Ceramic capacitor)
1
2
3
4
5
Input voltage V
IN
(V)
6
7
0
0
Sheet No.: OP06028
3
SHARP [ SHARP ELECTRIONIC COMPONENTS ]
