BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
Rev.7.6_00
(3) S-8241ABW, S-8241ABY
Table 12
Test
Test
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Condition Circuit
DELAY TIME (Ta = 25 °C)
⎯
⎯
⎯
⎯
⎯
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
0.175
87.5
5.6
0.25
125
8
0.325
162.5
10.4
2.6
s
8
8
9
9
9
1
1
1
1
1
tDL
ms
ms
ms
tlOV1
tlOV2
1.4
2
Load short-circuiting detection delay time tSHORT
DELAY TIME (Ta = 40 to
85 °C) *1
⎯
10
50
μs
−
+
⎯
⎯
⎯
⎯
⎯
1
1
1
1
1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
0.138
69
0.25
125
8
0.425
212
14
s
8
8
9
9
9
tDL
ms
ms
ms
tIOV1
tIOV2
4.4
1.1
⎯
2
3.4
Load short-circuiting detection delay time tSHORT
10
73
μs
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
(4) S-8241ABR, S-8241ACD
Table 13
Test
Test
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Condition Circuit
DELAY TIME (Ta = 25 °C)
⎯
⎯
⎯
⎯
⎯
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
8
8
9
9
9
1
1
1
1
1
1.4
87.5
5.6
1.4
⎯
2.0
125
8
2.6
162.5
10.4
2.6
s
tDL
ms
ms
ms
tlOV1
tlOV2
2
Load short-circuiting detection delay time tSHORT
DELAY TIME (Ta = 40 to
85 °C) *1
10
50
μs
−
+
⎯
⎯
⎯
⎯
⎯
1
1
1
1
1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
tCU
1.1
69
2.0
125
8
3.4
212
14
s
8
8
9
9
9
tDL
ms
ms
ms
tIOV1
tIOV2
4.4
1.1
⎯
2
3.4
73
Load short-circuiting detection delay time tSHORT
10
μs
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
Seiko Instruments Inc.
13
SII [ SEIKO INSTRUMENTS INC ]
