Si5317
Table 4. AC Characteristics (Continued)
(V
DD
= 1.8 ±5%, 2.5 ±10%, or 3.3 V ±10%, T
A
= –40 to 85 ºC)
Parameter
LVCMOS Output Pins
Rise/Fall Times
LOSn Trigger Window
Time to Clear LOS Alarm
Symbol
t
RF
Test Condition
CLOAD = 20 pf
See Figure 2
Min
—
Typ
25
—
Max
—
750
220
Units
ns
µs
ms
LOS
TRIG
From L
VST
CKIN to LOS
Measured from appearance
t
LOSCLR
of valid CKIN to
of
LOS
alarm
f
in
unchanged and XA/XB
stable.
LOS
to
LOL
90
—
Time to Clear LOL after LOS Cleared t
CLRLOL
—
10
—
ms
PLL Performance
Lock Time
Closed Loop Jitter Peaking
Jitter Tolerance
Minimum Reset Pulse Width
Lock Time
Spurious Noise
t
LOCKHW
RST
with valid CKIN to
LOL; BW = 100 Hz
J
PK
J
TOL
t
RSTMIN
t
LOCKMP
SP
SPUR
Reset b
to
of LOL
Max spur @ n x f3
(n > 1, n x f3 < 100 MHz)
BW determined by
BWSEL[1:0]
—
—
5000/
BW
1
—
—
0.05
—
—
35
—
1.2
0.1
—
—
1000
–75
sec
dB
ns pk-
pk
µs
ms
dBc
Preliminary Rev. 0.15
11
SILABS [ SILICON LABORATORIES ]
