BTB/BTA10
Discrete Triacs(Non-Isolated/Isolated)
F ig. 7 R ela tive variation of gate trigger current,
:
holding current and latching current vers us
junction temperature (typical values).
IG T,IH,IL [T j] / IG,IH,IL [T j=25°C ]
T
F ig. 8 R ela tive variation of critica l rate of decreas e
:
of main current versus (dV /dt)c (typical values).
2.5
2.0
2.0
1.8
1.6
1.4
(dI/dt)c [(dV /dt)c ] / S pec ified (dI/dt)c
C
B
IG T
1.5
1.0
0.5
T j(°C )
0.0
-40
-20
0
20
40
60
80
100
120
140
IH & IL
1.2
1.0
0.8
0.6
0.4
0.1
1.0
(dV /dt)c (V /µs )
10.0
B W/C W
100.0
F ig. 9 R elative varia tion of critical rate of
:
decreas e of main current vers us junction
temperature.
(dI/dt)c [T j] / (dI/dt)c [T j s pec ified]
6
5
4
3
2
1
0
0
25
50
T j (°C )
75
100
125
SIRECTIFIER [ SIRECTIFIER SEMICONDUCTORS ]
