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MBM29DL164TD-90PFTN 参数 Datasheet PDF下载

MBM29DL164TD-90PFTN图片预览
型号: MBM29DL164TD-90PFTN
PDF下载: 下载PDF文件 查看货源
内容描述: 闪存的CMOS 16M ( 2M ×8 / 1M ×16 )位双操作 [FLASH MEMORY CMOS 16M (2M X 8/1M X 16) BIT Dual Operation]
分类和应用: 闪存存储内存集成电路光电二极管
文件页数/大小: 74 页 / 1090 K
品牌: SPANSION [ SPANSION ]
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MBM29DL16XTD/BD-70/90  
GENERAL DESCRIPTION  
The MBM29DL16XTD/BD are a 16M-bit, 3.0 V-only Flash memory organized as 2M bytes of 8 bits each or 1M  
words of 16 bits each. The MBM29DL16XTD/BD are offered in a 48-pin TSOP(1) and 48-ball FBGA Package.  
These devices are designed to be programmed in-system with the standard system 3.0 V VCC supply. 12.0 V  
VPP and 5.0 V VCC are not required for write or erase operations. The devices can also be reprogrammed in  
standard EPROM programmers.  
MBM29DL16XTD/BD are organized into two banks, Bank 1 and Bank 2, which are considered to be two separate  
memory arrays for operations. It is the Fujitsu’s standard 3 V only Flash memories, with the additional capability  
of allowing a normal non-delayed read access from a non-busy bank of the array while an embedded write (either  
a program or an erase) operation is simultaneously taking place on the other bank.  
In the MBM29DL16XTD/BD, a new design concept is implemented, so called “Sliding Bank Architecture”. Under  
this concept, the MBM29DL16XTD/BD can be produced a series of devices with different Bank 1/Bank 2 size  
combinations; 0.5 Mb/15.5 Mb, 2 Mb/14 Mb, 4 Mb/12 Mb, 8 Mb/8 Mb.  
The standard MBM29DL16XTD/BD offer access times 70 ns and 90 ns, allowing operation of high-speed  
microprocessors without wait states. To eliminate bus contention the devices have separate chip enable (CE),  
write enable (WE), and output enable (OE) controls.  
The MBM29DL16XTD/BD are pin and command set compatible with JEDEC standard E2PROMs. Commands  
are written to the command register using standard microprocessor write timings. Register contents serve as  
input to an internal state-machine which controls the erase and programming circuitry. Write cycles also internally  
latch addresses and data needed for the programming and erase operations. Reading data out of the devices  
is similar to reading from 5.0 V and 12.0 V Flash or EPROM devices.  
The MBM29DL16XTD/BD are programmed by executing the program command sequence. This will invoke the  
Embedded Program Algorithm which is an internal algorithm that automatically times the program pulse widths  
and verifies proper cell margin. Typically, each sector can be programmed and verified in about 0.5 seconds.  
Erase is accomplished by executing the erase command sequence. This will invoke the Embedded Erase  
Algorithm which is an internal algorithm that automatically preprograms the array if it is not already programmed  
before executing the erase operation. During erase, the devices automatically time the erase pulse widths and  
verify proper cell margin.  
A sector is typically erased and verified in 1.0 second. (If already completely preprogrammed.)  
The devices also feature a sector erase architecture. The sector mode allows each sector to be erased and  
reprogrammed without affecting other sectors. The MBM29DL16XTD/BD are erased when shipped from the  
factory.  
The devices feature single 3.0 V power supply operation for both read and write functions. Internally generated  
and regulated voltages are provided for the program and erase operations. A low VCC detector automatically  
inhibits write operations on the loss of power. The end of program or erase is detected by Data Polling of DQ7,  
by the Toggle Bit feature on DQ6, or the RY/BY output pin. Once the end of a program or erase cycle has been  
completed, the devices internally reset to the read mode.  
Fujitsu’s Flash technology combines years of EPROM and E2PROM experience to produce the highest levels  
of quality, reliability, and cost effectiveness. The MBM29DL16XTD/BD memories electrically erase the entire  
chip or all bits within a sector simultaneously via Fowler-Nordhiem tunneling. The bytes/words are programmed  
one byte/word at a time using the EPROM programming mechanism of hot electron injection.  
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