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S29GL064N90BFI030 参数 Datasheet PDF下载

S29GL064N90BFI030图片预览
型号: S29GL064N90BFI030
PDF下载: 下载PDF文件 查看货源
内容描述: 64兆, 32兆3.0伏只页面模式闪存设有110纳米的MirrorBit工艺技术 [64 Megabit, 32 Megabit 3.0-Volt only Page Mode Flash Memory Featuring 110 nm MirrorBit Process Technology]
分类和应用: 闪存
文件页数/大小: 79 页 / 3123 K
品牌: SPANSION [ SPANSION ]
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D at a
S hee t
Table 9.2
System Interface String
Addresses (x16) Addresses (x8)
1Bh
1Ch
1Dh
1Eh
1Fh
20h
21h
22h
23h
24h
25h
26h
36h
38h
3Ah
3Ch
3Eh
40h
42h
44h
46h
48h
4Ah
4Ch
Data
0027h
0036h
0000h
0000h
0007h
0007h
000Ah
0000h
0003h
0005h
0004h
0000h
Description
V
CC
Min. (write/erase)
D7–D4: volt, D3–D0: 100 millivolt
V
CC
Max. (write/erase)
D7–D4: volt, D3–D0: 100 millivolt
V
PP
Min. voltage (00h = no V
PP
pin present)
V
PP
Max. voltage (00h = no V
PP
pin present)
Reserved for future use
Typical timeout for Min. size buffer write 2
N
µs
(00h = not supported)
Typical timeout per individual block erase 2
N
ms
Typical timeout for full chip erase 2
N
ms (00h = not supported)
Max. timeout for byte/word program 2
N
times typical.
Max. timeout for buffer write 2
N
times typical
Max. timeout per individual block erase 2
N
times typical
Max. timeout for full chip erase 2
N
times typical
(00h = not supported)
Note
CFI data related to V
CC
and time-outs may differ from actual V
CC
and time-outs of the product. Please consult the Ordering Information
tables to obtain the V
CC
range for particular part numbers. Please consult the Erase and Programming Performance table for typical timeout
specifications.
38
S29GL-N MirrorBit
®
Flash Family
S29GL-N_01_09 November 16, 2007