2 Mbit / 4 Mbit SPI Serial Flash
SST25VF040
EOL Product Data Sheet
TABLE 10: Reliability Characteristics
Symbol
Parameter
Endurance
Data Retention
Latch Up
Minimum Specification
Units
Test Method
1
NEND
10,000
100
Cycles JEDEC Standard A117
1
TDR
Years
mA
JEDEC Standard A103
JEDEC Standard 78
1
ILTH
100 + IDD
T10.0 1231(04)
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 11: AC Operating Characteristics VDD = 2.7-3.6V
Limits
Symbol
FCLK
Parameter
Min
Max
Units
MHz
ns
Serial Clock Frequency
Serial Clock High Time
Serial Clock Low Time
Serial Clock Rise Time
Serial Clock Fall Time
CE# Active Setup Time
CE# Active Hold Time
CE# Not Active Setup Time
CE# Not Active Hold Time
CE# High Time
20
TSCKH
TSCKL
TSCKR
TSCKF
20
20
ns
5
5
ns
ns
1
TCES
20
20
ns
1
TCEH
ns
1
TCHS
10
ns
1
TCHH
10
ns
TCPH
TCHZ
TCLZ
TDS
100
ns
CE# High to High-Z Output
SCK Low to Low-Z Output
Data In Setup Time
20
ns
0
4
ns
ns
TDH
THLS
THHS
THLH
THHH
THZ
Data In Hold Time
5
ns
HOLD# Low Setup Time
HOLD# High Setup Time
HOLD# Low Hold Time
HOLD# High Hold Time
HOLD# Low to High-Z Output
HOLD# High to Low-Z Output
Output Hold from SCK Change
Output Valid from SCK
Sector-Erase
10
10
15
10
ns
ns
ns
ns
20
20
ns
TLZ
ns
TOH
TV
0
ns
23
25
ns
TSE
ms
ms
ms
TBE
Block-Erase
25
TSCE
TBP
Chip-Erase
100
20
Byte-Program
µs
T11.2 1231(04)
1. Relative to SCK.
©2006 Silicon Storage Technology, Inc.
S71231(04)-00-000 10/06
17
SST [ SILICON STORAGE TECHNOLOGY, INC ]
