FERRITE CHIP BEADS 4 LINE ARRAY (NORMAL USAGE)
A4K SERIES
8. RELIABILITY & TEST CONDITION :
ITEM
Loading at High
Temperature
PERFORMANCE
Appearance : No damage.
Impedance : Within ±30% of initial value.
TEST CONDITION
Temperature : 125±5°C
Applied Current : rated current
Duration : 500±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Humidity : 90~95% RH.
Temperature : 40±2°C
Duration : 500±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Humidity
Thermal Shock
Appearance : No damage.
Impedance : Within ±30% of initial value.
Phase
1
2
Temperature (°C)
-55±2°C
+125±5°C
Times (min.)
30±3
30±3
For A Series :
Condition for 1 cycle
Step1 : -55±2°C 30±3 min.
Step2 : +125±5°C 30±3 min.
Number of cycles : 5
Measured at room temperature after placing for 2 to 3hrs.
Temperature : -55±2°C
Duration : 500±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Measured : 5 times
Low temperature storage test
NOTE : Specifications subject to change without notice. Please check our website for latest information.
18.06.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 5
SUPERWORLD [ SUPERWORLD ELECTRONICS ]
