CERAMIC CHIP INDUCTORS
6. RELIABILITY & TEST CONDITION :
C1 SERIES
ITEM
Low Temperature
Storage test
PERFORMANCE
Appearance : No mechanical damage.
Inductance : Within ±20% of initial value.
TEST CONDITION
Temperature : -40±2°C
Duration : 1008±12hrs
Measurement : After placing for 24 hours (min.) at room
ambient temperature
Temperature : -40°C, +85°C kept stabilized for
30 minutes each
Cycle : 100 cycles
Measurement : After placing for 24 hours (min.) at room
ambient temperature
Thermal Shock
Appearance : No mechanical damage.
Inductance : Within ±20% of initial value.
Vibration Test
Appearance : No mechanical damage.
Inductance : Within ±20% of initial value.
Waveform : Sine wave
Frequency : 10-55-10Hz for 1 min.
Amplitude : 1.5mm(peak-peak)
Directions & times : X, Y, Z directions for 2 hours.
A period of 2 hours in each of 3 mutually perpendicular
directions (Total 6 hours).
NOTE : Specifications subject to change without notice. Please check our website for latest information.
04.06.2009
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 5
SUPERWORLD [ SUPERWORLD ELECTRONICS ]
