CERAMIC CHIP INDUCTORS
8. RELIABILITY & TEST CONDITION :
C1 SERIES
ITEM
Bending Strength
PERFORMANCE
The ferrite should not be damaged by forces
applied on the right condition.
R0.5(0.02)
1.0(0.039)
TEST CONDITION
Chip
A
High Temperature Resistance
Appearance : No damage.
Inductance : Within ±20% of initial value.
Temperature : 85±5°C
Applied Current : rated current
Duration : 1008±12hrs
Measurement : After placing for at least 24hrs.
Humidity : 90~95% RH.
Temperature : 60±2°C
Applied Current : rated current (max.)
Duration : 1008±12hrs
Measurement : After placing for at least 24hrs.
Humidity Resistance
Thermal Shock
Appearance : Cracking, chipping or any other
defects that are harmful to the characteristics
shall not be allowed.
Inductance : Within ±20% of initial value.
Phase
1
Temperature (°C)
-40±2°C
+85±5°C
Times (min.)
30
30
For C Series :
Condition for 1 cycle
Step1 : -40±2°C 30 min.
Step2 : +85±5°C 30 min.
Number of cycles : 100
Measurement : After placing for at least 24hrs.
Temperature : -40±2°C
Duration : 1008±12hrs
Measurement : After placing for at least 24hrs.
Low temperature storage test
2
Measured : 100 times
NOTE : Specifications subject to change without notice. Please check our website for latest information.
26.09.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 5
SUPERWORLD [ SUPERWORLD ELECTRONICS ]
