®
TAK CHEONG
ELECTRICAL CHARACTERISTICS
(T
A
= 25℃ unless otherwise noted. )
Zener Voltage
(Note 2.)
Device
(Note 1.)
Device
Marking
Min
1N5261B
1N5262B
1N5263B
1N5264B
1N5265B
1N5266B
1N5267B
1N5268B
1N5269B
1N5270B
1N5271B
1N5272B
1N5273B
1N5274B
1N5275B
1N5276B
1N5277B
1N5278B
1N5279B
1N5280B
1N5281B
1N5261B
1N5262B
1N5263B
1N5264B
1N5265B
1N5266B
1N5267B
1N5268B
1N5269B
1N5270B
1N5271B
1N5272B
1N5273B
1N5274B
1N5275B
1N5276B
1N5277B
1N5278B
1N5279B
1N5280B
1N5281B
44.65
48.45
53.20
57.00
58.90
64.60
71.25
77.90
82.65
86.45
95.0
104.5
114.0
123.5
133.0
142.5
152.0
161.5
171.0
180.5
190.0
V
Z
(Volts)
Nom
47
51
56
60
62
68
75
82
87
91
100
110
120
130
140
150
160
170
180
190
200
Max
49.35
53.55
58.80
63.00
65.10
71.40
78.75
86.10
91.35
95.55
105.0
115.5
126.0
136.5
147.0
157.5
168.0
178.5
189.0
199.5
210.0
@I
ZT
(mA)
2.7
2.5
2.2
2.1
2.0
1.8
1.7
1.5
1.4
1.4
1.3
1.1
1.0
0.95
0.9
0.85
0.8
0.74
0.68
0.66
0.65
Licensed by
ON Semiconductor
,
A trademark of
semiconductor
Components Industries, LLC for
Zener Technology
and
Products
.
Zener Impedance
(Note 3.)
Z
ZT
@I
ZT
(Ω)
105
125
150
170
185
230
270
330
370
400
500
750
900
1100
1300
1500
1700
1900
2200
2400
2500
Z
ZK
@I
ZK
(Ω)
1000
1100
1300
1400
1400
1600
1700
2000
2200
2300
2600
3000
4000
4500
4500
5000
5500
5500
6000
6500
7000
(mA)
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
0.25
Leakage Current
I
R
@ V
R
(uA Max)
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
(Volts)
36
39
43
46
47
52
56
62
68
69
76
84
91
99
106
114
122
129
137
144
152
θ
VZ
(Note 4.)
(mA)
+0.095
+0.096
+0.096
+0.097
+0.097
+0.097
+0.098
+0.098
+0.099
+0.099
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
+0.11
V
F
= 1.1V Max @I
F
= 200mA for 60V below types, V
F
= 1.4V Max @I
F
= 200mA for 60V above types
2. TOLERANCE AND TYPE NUMBER DESIGNATION (V
Z
)
The type numbers listed have a standard tolerance on the nominal zener voltage of
±
5%.
3. ZENER VOLTAGE (V
Z
) MEASUREMENT
The zener voltage (V
Z
) is tested under pulse condition. The measured
V
Z
is guaranteed to be within specification with device
junction in thermal equilibrium.
4. ZENER IMPEDANCE (Z
Z
) DERIVATION
Z
ZT
and
Z
Zk
are measured by dividing the AC voltage drop across the device by the AC current applied. The specified limits are
for I
Z(AC)
= 0.1
I
Z(DC)
with AC frequency = 60Hz.
5. TEMPERATURE COEFFICIENT (θ
VZ)
Test conditions for temperature coefficient are as follows:
A. I
ZT
= 7.5mA, T1 = 25℃, T2 = 125℃ (1N5221B through 1N5242B)
B.
I
ZT
= Rated
I
ZT
, T1 = 25℃, T2= 125℃ (1N5243B through 1N5281B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature.
November 2006 / C
Page 3
TAK_CHEONG [ Tak Cheong Electronics (Holdings) Co.,Ltd ]
