3-1/2 DIGIT ANALOG-TO-DIGITAL
CONVERTERS WITH HOLD
TC7116
TC7116A
TC7117
TC7117A
ABSOLUTE MAXIMUM RATINGS*
Supply Voltage
Operating Temperature
TC7116/TC7116A: V+ to V– .................................15V
TC7117/TC7117A: V+ to GND............................. +6V
V– to GND ............................– 9V
“C” Device.............................................. 0°C to +70°C
“I” Device .......................................... – 25°C to +85°C
Storage Temperature ............................ – 65°C to +150°C
Lead Temperature (Soldering, 10 sec) ................. +300°C
Analog Input Voltage (Either Input) (Note 1) ........ V+ to V–
Reference Input Voltage (Either Input)................. V+ to V–
Clock Input
*Static-sensitive device. Unused devices must be stored in conductive
material. Protect devices from static discharge and static fields. Stresses
above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. These are stress ratings only and functional
operation of the device at these or any other conditions above those
indicated in the operational sections of the specifications is not implied.
Exposure to Absolute Maximum Rating Conditions for extended periods
may affect device reliability.
TC7116/TC7116A..................................... TEST to V+
TC7117/TC7117A...................................... GND to V+
Package Power Dissipation, TA ≤ 70°C (Note 2)
CerDIP ..............................................................2.29W
Plastic DIP ........................................................1.23W
Plastic Chip Carrier (PLCC)..............................1.23W
Plastic Quad Flat Package (PQFP) ..................1.00W
ELECTRICAL CHARACTERISTICS (Note 3)
Parameter
Test Conditions
Min
Typ
Max
Unit
Zero Input Reading
VIN = 0V
—
±0
—
Digital
Full Scale = 200 mV
Reading
Ratiometric Reading
VIN = VREF
VREF = 100 mV
999
– 1
999/1000
1000
+1
Digital
Reading
Roll-Over Error (Difference in
Reading for Equal Positive and
Negative Readings Near Full Scale)
–VIN = +VIN 200 mV or ≈ 2V
±0.2
Counts
Linearity (Maximum Deviation From
Best Straight Line Fit)
Full Scale = 200 mV or 2V
– 1
—
—
—
±0.2
50
15
1
+1
—
—
10
Counts
µV/V
µV
Common-Mode Rejection Ratio (Note 4)
VCM = ±1V, VIN = 0V
Full Scale = 200 mV
Noise (Peak-to-Peak Value Not
Exceeded 95% of Time)
VIN = 0V
Full Scale = 200 mV
Leakage Current at Input
Zero Reading Drift
VIN = 0V
pA
V
IN = 0V
“C” Device: 0°C to +70°C
“I” Device: –25°C to +85°C
—
—
0.2
1
1
2
µV/°C
µv/°C
Scale Factor Temperature Coefficient
VIN = 199 mV
“C” Device: 0°C to +70°C
(Ext Ref = 0 ppm/°C)
“I” Device: –25°C to +85°C
—
1
5
ppm/°C
—
30
—
70
—
20
—
ppm/°C
Input Resistance, Pin 1
VIL, Pin 1
Note 6
kΩ
V
TC7116/A Only
TC7117/A Only
Both
—
Test +1.5
GND +1.5
—
VIL, Pin 1
—
V+ – 1.5
—
V
VIH, Pin 1
—
V
Supply Current (Does Not Include
LED Current for 7117/A)
VIN = 0V
—
0.8
1.8
mA
Analog Common Voltage
25 kΩ Between Common
2.4
3.05
3.35
V
(With Respect to Positive Supply)
and Positive Supply
Temperature Coefficient of Analog Common
(With Respect to Positive Supply)
"C" Device: 0°C to +70°C
TC7116A/TC7117A
TC7116/TC7117
—
—
20
80
50
—
ppm/°C
ppm/°C
3-204
TELCOM SEMICONDUCTOR, INC.
TELCOM [ TELCOM SEMICONDUCTOR, INC ]
