SN65220
SN65240
SN75240
SLLS266F − FEBRUARY 1997 − REVISED JULY 2004
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate
precautions. Failure to observe proper handling and installation procedures can cause damage.
IEC1000-4-2 COMPLIANCE LEVEL
MAXIMUM TEST VOLTAGE
IEC1000-4-2
COMPLIANCE
LEVEL
1
2
3
4
CONTACT
DISCHARGE
(kV)
2
4
6
8
AIR
DISCHARGE
(kV)
2
4
8
15
PACKAGE/ORDERING INFORMATION
PRODUCT
SUPRESSORS
TA
PACKAGE
WCSP−4
SN65220
1
−40°C to 85°C
SOT23−6
DIP−8
SN65240
2
−40 C 85 C
−40°C to 85°C
TSSOP−8
DIP−8
SN75240
2
0 C 70 C
0°C to 70°C
TSSOP−8
DBV
P
PW
P
PW
A75240
A65240
PACKAGE
DESIGNATOR
YZB
MARKED
AS
NWP or
65220
SADI
ORDER NUMBER
SN65220YZBR (Reel)
SN65220YZBT (Mini Reel)
SN65220DBVR (Reel)
SN65220DBVT (Mini Reel)
SN65240P (Rail)
SN65240PW (Rail)
SN65240PWR (Reel)
SN75240P (Rail)
SN75240PW (Rail)
SN75240PWR (Reel)
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
UNIT
Continuous power dissipation
Electrostatic discharge
Peak power dissipation, PD(peak)
Peak forward surge current, IFSM
Peak reverse surge current, IRSM
See Dissipation Rating Table
15 kV(2), 2 kV(3)
60 W
3A
−9 A
Storage temperature range, Tstg
−65°C to 150°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade
device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is
not implied.
(2) Human Body Model − Tested in accordance with JEDEC Standard 22, Test Method A114−A.
(3) Charged Device Model − Tested in accordance with JEDEC Standard 22, Test Method C101.
2
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