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CD-700-KAC-NCC-77.760 参数 Datasheet PDF下载

CD-700-KAC-NCC-77.760图片预览
型号: CD-700-KAC-NCC-77.760
PDF下载: 下载PDF文件 查看货源
内容描述: 基于锁相环完整的VCXO [Complete VCXO Based Phase Lock Loop]
分类和应用: 石英晶振压控振荡器
文件页数/大小: 14 页 / 123 K
品牌: VECTRON [ Vectron International, Inc ]
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CD-700, VCXO Based PLL  
Absolute Maximum Ratings  
Test Conditions (25±5°C)  
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional  
operation is not implied at these or any other conditions in excess of conditions represented in the  
operational sections of this data sheet. Exposure to absolute maximum ratings for extended periods may  
adversely affect device reliability.  
Table 2. Absolute Maximum Ratings  
Parameter  
Power Supply  
Storage Temperature  
Soldering Temperature/Duration  
Clock and Data Input Range  
Symbol  
VDD  
Tstorage  
TPEAK / tP  
Ratings  
7
-55/125  
Unit  
Vdc  
°C  
°C/sec  
V
260 / 40  
CLKIN, DATAIN  
Gnd-0.5 to VDD +0.5  
Reliability  
The CD-700 is capable of meeting the following qualification tests.  
Table 3. Environmental Compliance  
Parameter  
Mechanical Shock  
Mechanical Vibration  
Solderability  
Conditions  
MIL-STD-883, Method 2002  
MIL-STD-883, Method 2007  
MIL-STD-883, Method 2003  
Gross and Fine Leak  
Resistance to Solvents  
MIL-STD-883, Method 1014, 100% Tested  
MIL-STD-883, Method 2016  
Handling Precautions  
Although ESD protection circuitry has been designed into the the CD-700, proper precautions should be  
taken when handling and mounting. VI employs a Human Body Model (HBM) and a Charged Device  
Model (CDM) for ESD susceptibility testing and design protection evaluation. ESD thresholds are  
dependent on the circuit parameters used to define the model.  
Table 4. Predicted ESD Ratings  
Model  
Human Body Model  
Charged Device Model  
Minimum  
1500 V  
1000 V  
Conditions  
MIL-STD 883, Method 3015  
JESD 22-C101  
Vectron International, 267 Lowell Rd, Hudson NH 03051-4916  
Page 3 of 14  
Tel: 1-88-VECTRON-1 Web: www.vectron.com  
Rev : 06Apr08