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CD-700-KAC-NED-77.760 参数 Datasheet PDF下载

CD-700-KAC-NED-77.760图片预览
型号: CD-700-KAC-NED-77.760
PDF下载: 下载PDF文件 查看货源
内容描述: 基于锁相环完整的VCXO [Complete VCXO Based Phase Lock Loop]
分类和应用: 石英晶振压控振荡器
文件页数/大小: 14 页 / 123 K
品牌: VECTRON [ Vectron International, Inc ]
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CD-700, VCXO Based PLL
Test Conditions (25±5°C)
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional
operation is not implied at these or any other conditions in excess of conditions represented in the
operational sections of this data sheet. Exposure to absolute maximum ratings for extended periods may
adversely affect device reliability.
Table 2. Absolute Maximum Ratings
Parameter
Power Supply
Storage Temperature
Soldering Temperature/Duration
Clock and Data Input Range
Symbol
V
DD
Tstorage
T
PEAK
/ t
P
CLKIN, DATAIN
Ratings
7
-55/125
260 / 40
Gnd-0.5 to V
DD
+0.5
Unit
Vdc
°C
°C/sec
V
Reliability
The CD-700 is capable of meeting the following qualification tests.
Table 3. Environmental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross and Fine Leak
Resistance to Solvents
Conditions
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014, 100% Tested
MIL-STD-883, Method 2016
Handling Precautions
Although ESD protection circuitry has been designed into the the CD-700, proper precautions should be
taken when handling and mounting. VI employs a Human Body Model (HBM) and a Charged Device
Model (CDM) for ESD susceptibility testing and design protection evaluation. ESD thresholds are
dependent on the circuit parameters used to define the model.
Table 4. Predicted ESD Ratings
Model
Human Body Model
Charged Device Model
Minimum
1500 V
1000 V
Conditions
MIL-STD 883, Method 3015
JESD 22-C101
Vectron International, 267 Lowell Rd, Hudson NH 03051-4916
Page 3 of 14
Tel: 1-88-VECTRON-1
Web:
www.vectron.com
Rev : 06Apr08